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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 27 — Sep. 20, 2012
  • pp: 6471–6479

Method of excess fractions with application to absolute distance metrology: Wavelength selection and the effects of common error sources

Konstantinos Falaggis, David P. Towers, and Catherine E. Towers  »View Author Affiliations


Applied Optics, Vol. 51, Issue 27, pp. 6471-6479 (2012)
http://dx.doi.org/10.1364/AO.51.006471


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Abstract

Multiwavelength interferometry (MWI) is a well established technique in the field of optical metrology. Previously, we have reported a theoretical analysis of the method of excess fractions that describes the mutual dependence of unambiguous measurement range, reliability, and the measurement wavelengths. In this paper wavelength, selection strategies are introduced that are built on the theoretical description and maximize the reliability in the calculated fringe order for a given measurement range, number of wavelengths, and level of phase noise. Practical implementation issues for an MWI interferometer are analyzed theoretically. It is shown that dispersion compensation is best implemented by use of reference measurements around absolute zero in the interferometer. Furthermore, the effects of wavelength uncertainty allow the ultimate performance of an MWI interferometer to be estimated.

© 2012 Optical Society of America

OCIS Codes
(060.2370) Fiber optics and optical communications : Fiber optics sensors
(100.2650) Image processing : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.4800) Instrumentation, measurement, and metrology : Optical standards and testing

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: April 18, 2012
Revised Manuscript: July 17, 2012
Manuscript Accepted: August 6, 2012
Published: September 11, 2012

Citation
Konstantinos Falaggis, David P. Towers, and Catherine E. Towers, "Method of excess fractions with application to absolute distance metrology: Wavelength selection and the effects of common error sources," Appl. Opt. 51, 6471-6479 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-27-6471


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References

  1. A. A. Michelson and J. R. Benoit, “Détermination expérimentale de la valeur du mètre en longueurs d’ondes lumineuses,” Trav. Et Mem. Bur. Int. Poids es Mes. 11, 1–42 (1895).
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  8. C. E. Towers, D. P. Towers, and J. D. C. Jones, “Optimum frequency selection in multifrequency interferometry,” Opt. Lett. 28, 887–889 (2003). [CrossRef]
  9. K. Falaggis, D. P. Towers, and C. E. Towers, “Multiwavelength interferometry: Extended range metrology,” Opt. Lett. 34, 950–952 (2009). [CrossRef]
  10. K. Falaggis, D. P. Towers, and C. E. Towers, “Optimum wave-length selection for the method of excess fractions,” Proc. SPIE 7063, 70630V (2008). [CrossRef]
  11. K. Falaggis and C. E. Towers, “Absolute metrology by phase and frequency modulation for multiwavelength interferometry,” Opt. Lett. 36, 2928–2930 (2011). [CrossRef]

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