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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 27 — Sep. 20, 2012
  • pp: 6571–6577

Technique for in situ measurement of free spectral range and transverse mode spacing of optical cavities

Alberto Stochino, Koji Arai, and Rana X. Adhikari  »View Author Affiliations


Applied Optics, Vol. 51, Issue 27, pp. 6571-6577 (2012)
http://dx.doi.org/10.1364/AO.51.006571


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Abstract

Length and g-factor are fundamental parameters that characterize optical cavities. We developed a technique to measure these parameters in situ by determining the frequency spacing between the resonances of fundamental and spatial modes of an optical cavity. Two laser beams are injected into the cavity, and their relative frequency is scanned by a phase-lock loop, while the cavity is locked to either laser. The measurement of the amplitude of their beat note in transmission reveals the resonances of the longitudinal and the transverse modes of the cavity and their spacing. This method proves particularly useful to characterize complex optical systems, including very long and/or coupled optical cavities, as in gravitational-wave interferometers. This technique and the results of its application to the coupled cavities of a 40 m-long gravitational-wave interferometer prototype are presented here.

© 2012 Optical Society of America

OCIS Codes
(120.2230) Instrumentation, measurement, and metrology : Fabry-Perot
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3940) Instrumentation, measurement, and metrology : Metrology
(350.1270) Other areas of optics : Astronomy and astrophysics

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: June 14, 2012
Manuscript Accepted: July 30, 2012
Published: September 17, 2012

Citation
Alberto Stochino, Koji Arai, and Rana X. Adhikari, "Technique for in situ measurement of free spectral range and transverse mode spacing of optical cavities," Appl. Opt. 51, 6571-6577 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-27-6571

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