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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 28 — Oct. 1, 2012
  • pp: 6805–6817

Mueller matrix polarimetry with four photoelastic modulators: theory and calibration

Oriol Arteaga, John Freudenthal, Baoliang Wang, and Bart Kahr  »View Author Affiliations

Applied Optics, Vol. 51, Issue 28, pp. 6805-6817 (2012)

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A spectroscopic Mueller matrix polarimeter with four photoelastic modulators (PEMs) and no moving parts is introduced. In the 4-PEM polarimeter, all the elements of the Mueller matrix are simultaneously determined from the analysis of the frequencies of the time-dependent intensity of the light beam.

© 2012 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.5060) Instrumentation, measurement, and metrology : Phase modulation
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(240.2130) Optics at surfaces : Ellipsometry and polarimetry

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: June 7, 2012
Revised Manuscript: August 16, 2012
Manuscript Accepted: August 20, 2012
Published: September 26, 2012

Oriol Arteaga, John Freudenthal, Baoliang Wang, and Bart Kahr, "Mueller matrix polarimetry with four photoelastic modulators: theory and calibration," Appl. Opt. 51, 6805-6817 (2012)

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