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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 28 — Oct. 1, 2012
  • pp: 6805–6817

Mueller matrix polarimetry with four photoelastic modulators: theory and calibration

Oriol Arteaga, John Freudenthal, Baoliang Wang, and Bart Kahr  »View Author Affiliations


Applied Optics, Vol. 51, Issue 28, pp. 6805-6817 (2012)
http://dx.doi.org/10.1364/AO.51.006805


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Abstract

A spectroscopic Mueller matrix polarimeter with four photoelastic modulators (PEMs) and no moving parts is introduced. In the 4-PEM polarimeter, all the elements of the Mueller matrix are simultaneously determined from the analysis of the frequencies of the time-dependent intensity of the light beam.

© 2012 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.5060) Instrumentation, measurement, and metrology : Phase modulation
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(240.2130) Optics at surfaces : Ellipsometry and polarimetry

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: June 7, 2012
Revised Manuscript: August 16, 2012
Manuscript Accepted: August 20, 2012
Published: September 26, 2012

Citation
Oriol Arteaga, John Freudenthal, Baoliang Wang, and Bart Kahr, "Mueller matrix polarimetry with four photoelastic modulators: theory and calibration," Appl. Opt. 51, 6805-6817 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-28-6805


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References

  1. B. Wang, E. Hinds, and E. Krivoy, “Basic optical properties of the photoelastic modulator part II: residual birefringence in the optical element,” Proc. SPIE 7461, 746110 (2009). [CrossRef]
  2. G. E. Jellison and F. A. Modine, “Two-modulator generalized ellipsometry: theory,” Appl. Opt. 36, 8190–8198 (1997). [CrossRef]
  3. G. E. Jellison and F. A. Modine, “Two-modulator generalized ellipsometry: experiment and calibration,” Appl. Opt. 36, 8184–8189 (1997). [CrossRef]
  4. G. E. Jellison and F. Modine, “Two modulator generalized ellipsometer for complete Mueller matrix measurement,” U.S. patent 5,956,147 (21 September, 1999).
  5. Jellison, J. D. Hunn, and C. M. Rouleau, “Normal-incidence generalized ellipsometry using the two-modulator generalized ellipsometry microscope,” Appl. Opt. 45, 5479–5488 (2006). [CrossRef]
  6. G. E. Jellison, C. O. Griffiths, D. E. Holcomb, and C. M. Rouleau, “Transmission two-modulator generalized ellipsometry measurements,” Appl. Opt. 41, 6555–6566 (2002). [CrossRef]
  7. O. Arteaga, Z. El-Hachemi, A. Canillas, and J. M. Ribó, “Transmission Mueller matrix ellipsometry of chirality switching phenomena,” Thin Solid Films 519, 2617–2623 (2011). [CrossRef]
  8. O. Arteaga, “Mueller matrix polarimetry of anisotropic chiral media,” Ph.D. thesis (University of Barcelona, 2010).
  9. L. Cross and D. Hore, “Dual-modulator broadband infrared Mueller matrix ellipsometry,” Appl. Opt. 51, 5100–5110 (2012). [CrossRef]
  10. R. C. Thompson, J. R. Bottiger, and E. S. Fry, “Measurement of polarized light interactions via the Mueller matrix,” Appl. Opt. 19, 1323–1332 (1980). [CrossRef]
  11. J. Badoz, M. P. Silverman, and J. C. Canit, “Wave propagation through a medium with static and dynamic birefringence: theory of the photoelastic modulator,” J. Opt. Soc. Am. A 7, 672–682 (1990). [CrossRef]
  12. G. E. Jellison and F. A. Modine, “Accurate calibration of a photoelastic modulator in polarization modulation ellipsometry,” Proc. SPIE 1166, 231–241 (1990).
  13. O. Acher, E. Bigan, and B. Drévillon, “Improvements of phase-modulated ellipsometry,” Rev. Sci. Instrum. 60, 65–77 (1989). [CrossRef]
  14. G. E. Jellison, F. A. Modine, and C. Chen, “Calibration procedures for a two-modular generalized ellipsometer,” Proc. SPIE 3754, 150–160 (1999). [CrossRef]
  15. A. Zeng, L. Huang, Z. Dong, J. Hu, H. Huang, and X. Wang, “Calibration method for a photoelastic modulator with a peak retardation of less than a half-wavelength,” Appl. Opt. 46, 699–703 (2007). [CrossRef]
  16. O. Arteaga, J. Freudenthal, and B. Kahr, “Reckoning electromagnetic principles with polarimetric measurements of anisotropic optically active crystals,” J. Appl. Crystallogr. 45, 279–291 (2012). [CrossRef]
  17. Y. Velikhov, I. Pritula, I. Canina, M. Kolybayeva, V. Puzikov, and A. Levchenko, “Growth and properties of dyed KDP crystals,” Cryst. Res. Technol. 42, 27–33 (2007). [CrossRef]
  18. I. Pritula, V. Gayvoronsky, Y. Gromov, M. Kopylovsky, M. Kolybaeva, V. Puzikov, A. Kosinova, Y. Savvin, Y. Velikhov, and A. Levchenko, “Linear and nonlinear optical properties of dye-doped KDP crystals: Effect of thermal treatment,” Opt. Commun. 282, 1141–1147 (2009). [CrossRef]
  19. B. Kahr and R. W. Gurney, “Dyeing crystals,” Chem. Rev. 101, 893–952 (2001). [CrossRef]
  20. Y. Bing, D. Selassie, R. H. Paradise, C. Isborn, N. Kramer, M. Sadilek, W. Kaminsky, and B. Kahr, “Circular dichroism tensor of a triarylmethyl propeller in sodium chlorate crystals,” J. Am. Chem. Soc. 132, 7454–7465 (2010). [CrossRef]

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