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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 29 — Oct. 10, 2012
  • pp: 6917–6925

Comprehensive characterization of broadband ultralow reflectance of a porous nickel–phosphorus black surface by numerical simulation

Kuniaki Amemiya, Daiji Fukuda, Takayuki Numata, Minoru Tanabe, and Yoshiro Ichino  »View Author Affiliations


Applied Optics, Vol. 51, Issue 29, pp. 6917-6925 (2012)
http://dx.doi.org/10.1364/AO.51.006917


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Abstract

Porous nickel–phosphorus (NiP) black surfaces exhibit excellent low reflectance in the visible and near-IR regions. Through use of a model of the surface morphology and composition, the reflectance was numerically simulated by a three-dimensional finite-difference time-domain method to determine the origin of the low reflectance. In agreement with experimental results, the simulations showed a spectrally flat, quite low reflectance of <0.1% over the entire visible–near-IR region under certain conditions. The reflectance depended strongly on the thickness of the black nickel oxide layer and the aspect ratio of the three-dimensional surface morphology. A method of validating the reflectance of porous NiP black surfaces is suggested.

© 2012 Optical Society of America

OCIS Codes
(000.4430) General : Numerical approximation and analysis
(120.5630) Instrumentation, measurement, and metrology : Radiometry
(120.5700) Instrumentation, measurement, and metrology : Reflection
(160.4670) Materials : Optical materials

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: July 24, 2012
Manuscript Accepted: August 20, 2012
Published: October 3, 2012

Citation
Kuniaki Amemiya, Daiji Fukuda, Takayuki Numata, Minoru Tanabe, and Yoshiro Ichino, "Comprehensive characterization of broadband ultralow reflectance of a porous nickel–phosphorus black surface by numerical simulation," Appl. Opt. 51, 6917-6925 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-29-6917


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