OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 3 — Jan. 20, 2012
  • pp: 385–389

Optimizing the identification of mono- and bilayer graphene on multilayer substrates

Christopher Kontis, Marcel R. Mueller, Christian Kuechenmeister, Klaus T. Kallis, and Joachim Knoch  »View Author Affiliations


Applied Optics, Vol. 51, Issue 3, pp. 385-389 (2012)
http://dx.doi.org/10.1364/AO.51.000385


View Full Text Article

Enhanced HTML    Acrobat PDF (330 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

This work presents an investigation and optimization of the identification of graphene mono- and bilayers on various multilayer substrates. Instead of the mere contrast between substrate and substrate/mono/bilayer systems, weighted color differences are used to obtain optimum visibility. Our approach employs a genetic algorithm that allows finding the most appropriate composition of multilayer systems in terms of materials in use and their respective thicknesses. A major benefit of our approach is the possibility to qualify appropriate layer systems with respect to their manufacturability.

© 2012 Optical Society of America

OCIS Codes
(310.3840) Thin films : Materials and process characterization
(310.6860) Thin films : Thin films, optical properties
(310.4165) Thin films : Multilayer design

ToC Category:
Materials

History
Original Manuscript: July 8, 2011
Revised Manuscript: October 4, 2011
Manuscript Accepted: October 4, 2011
Published: January 20, 2012

Citation
Christopher Kontis, Marcel R. Mueller, Christian Kuechenmeister, Klaus T. Kallis, and Joachim Knoch, "Optimizing the identification of mono- and bilayer graphene on multilayer substrates," Appl. Opt. 51, 385-389 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-3-385


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. K. S. Novoselov, A. K. Geim, S. V. Morozov, D. Jiang, M. I. Katsnelson, I. V. Grigorieva, S. V. Dubonos, and A. A. Firsov, “Two-dimensional gas of massless Dirac fermions in graphene,” Nature 438, 197–200 (2005). [CrossRef]
  2. B. Partoens and F. M. Peeters, “From graphene to graphite: electronic structure around the K-point,” Phys. Rev. B 74, 075404 (2006). [CrossRef]
  3. A. H. C. Neto, F. Guinea, N. M. R. Peres, K. S. Novoselov, and A. K. Geim, “The electronic properties of graphene,” Rev. Mod. Phys. 81, 109–162 (2009). [CrossRef]
  4. K. S. Novoselov, A. K. Geim, S. V. Morozov, D. Jiang, Y. Zhang, S. V. Dubonos, I. V. Grigorieva, and A. A. Firsov, “Electric field effect in atomically thin carbon films,” Science 306, 666–669 (2004). [CrossRef]
  5. P. W. Sutter, J.-I. Flege, and E. A. Sutter, “Epitaxial graphene on ruthenium,” Nature Materials 7, 406–411 (2008). [CrossRef]
  6. Y.-M. Lin, C. Dimitrakopoulos, K. A. Jenkins, D. B. Farmer, H.-Y. Chiu, A. Grill, and Ph. Avouris, “100 GHz transistors from wafer-scale epitaxial graphene,” Science 327, 662(2010). [CrossRef]
  7. A. Charrier, A. Coati, T. Argunova, F. Thibaudau, Y. Garreau, R. Pinchaux, I. Forbeaux, J.-M. Debever, M. Sauvage-Simkin, and J.-M. Themlin, “Solid-state decomposition of silicon carbide for growing ultra-thin heteroepitaxial graphite films,” J. Appl. Phys. 92, 2479 (2002). [CrossRef]
  8. A. Reina, H. Son, K. Jiao, B. Fan, M. S. Dresselhaus, Z. Liu, and J. Kong, “Transferring and identification of single- and few-layer graphene on arbitrary substrates,” J. Phys. Chem. Lett. 112, 17741–17744 (2008). [CrossRef]
  9. P. Blake, E. W. Hill, A. H. Castro Neto, K. S. Novoselov, D. Jiang, R. Yang, T. J. Booth, and A. K. Geim, “Making graphene visible,” Appl. Phys. Lett. 91, 063124 (2007). [CrossRef]
  10. L. Gao, W. Ren, F. Li, and H. Cheng, “Total color difference for rapid and accurate identification of graphene,” ACS Nano 2, 1625–1633 (2008). [CrossRef]
  11. I. Jung, M. Pelton, R. Piner, D. A. Dikin, S. Stankovich, S. Watcharotone, M. Hausner, and R. S. Ruoff, “Simple approach for high-contrast optical imaging and characterization of graphene-based sheets,” Nano Lett. 7, 3569–3575 (2007). [CrossRef]
  12. M. Friedemann, K. Pierz, R. Stosch, and F. J. Ahlers, “Graphene on gallium arsenide: engineering the visibility,” Appl. Phys. Lett. 95, 102103 (2009). [CrossRef]
  13. D. S. L. Abergel, A. Russell, and V. I. Fal’ko, “Visibility of graphene flakes on a dielectric substrate,” Appl. Phys. Lett. 91, 063125 (2007). [CrossRef]
  14. M. Bruna and S. Borini, “Assessment of graphene quality by quantitative optical contrast analysis,” J. Phys. D 42, 175307 (2009). [CrossRef]
  15. G. Teo, H. Wang, Y. Wu, Z. Guo, J. Zhang, Z. Ni, and Z. Shen, “Visibility study of graphene multilayer structures,” J. Appl. Phys. 12, 124302 (2008).
  16. Z. H. Ni, H. M. Wang, J. Kasmin, H. M. Fan, T. Yu, Y. H. Wu, Y. P. Feng, and Z. X. Shen, “Graphene thickness determination using reflection and contrast spectroscopy,” Nano Lett. 7, 2758–2763 (2007). [CrossRef]
  17. D. E. Goldberg, Genetic Algorithms in Search, Optimization and Machine Learning (Addison-Wesley, 1981).
  18. J. W. Weber, V. E. Calado, and M. C. M. van de Sanden, “Optical constants of graphene measured by spectroscopic ellipsometry,” Appl. Phys. Lett. 97, 091904 (2010). [CrossRef]
  19. M. V. Klein and T. E. Furtak, Optics (Springer, 1998).
  20. S. Roddaro, P. Pingue, V. Piazza, V. Pellegrini, and F. Beltram, “The optical visibility of graphene: interference colors of ultrathin graphite on SiO2,” Nano Lett. 7, 2707–2710(2007). [CrossRef]
  21. M. Richter, Einführung in die Farbmetrik, 2nd ed. (Gruyter, 1981).
  22. ISO/CIE 10527: CIE standard colorimetric observers, http://www.cie.co.at/ (2007).
  23. P. J. Bouma, Physical Apsects of Colour, 2nd ed. (Macmillan, 1971).

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited