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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 30 — Oct. 20, 2012
  • pp: 7345–7356

Polarimetric imaging beyond the speckle grain scale

Lucien Pouget, Julien Fade, Cyril Hamel, and Mehdi Alouini  »View Author Affiliations

Applied Optics, Vol. 51, Issue 30, pp. 7345-7356 (2012)

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We address an experimental Stokes imaging setup allowing one to explore the polarimetric properties of a speckle light field with spatial resolution well beyond the speckle grain scale. We detail how the various experimental difficulties inherent to such measurements can be overcome with a dedicated measurement protocol involving a careful speckle registration step. The setup and protocol are then validated on a metallic reference sample, and used to measure the state of polarization (SOP) of light in each pixel of highly resolved speckle patterns (>2000 pixels per speckle grain) resulting from the scattering of an incident coherent beam on samples exhibiting different polarimetric properties. Evolution of the SOP with spatial averaging and across adjacent speckle grains is eventually addressed.

© 2012 Optical Society of America

OCIS Codes
(030.0030) Coherence and statistical optics : Coherence and statistical optics
(110.6150) Imaging systems : Speckle imaging
(220.4830) Optical design and fabrication : Systems design
(260.5430) Physical optics : Polarization
(110.5405) Imaging systems : Polarimetric imaging

ToC Category:
Imaging Systems

Original Manuscript: June 12, 2012
Revised Manuscript: September 14, 2012
Manuscript Accepted: September 14, 2012
Published: October 18, 2012

Lucien Pouget, Julien Fade, Cyril Hamel, and Mehdi Alouini, "Polarimetric imaging beyond the speckle grain scale," Appl. Opt. 51, 7345-7356 (2012)

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