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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 30 — Oct. 20, 2012
  • pp: 7402–7410

Optics InfoBase > Applied Optics > Volume 51 > Issue 30 > Page 7402

Fine structures in refractive index of sapphire at the LII,III absorption edge of aluminum determined by soft x-ray resonant reflectivity

Arijeet Das, Rajkumar K. Gupta, Mohammed H. Modi, Chandrachur Mukherjee, Sanjay K. Rai, Aniruddha Bose, Tapas Ganguli, Satish C. Joshi, Gyan S. Lodha, and Sudip K. Deb  »View Author Affiliations


Applied Optics, Vol. 51, Issue 30, pp. 7402-7410 (2012)
http://dx.doi.org/10.1364/AO.51.007402


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Abstract

The optical constants of sapphire crystal (α-Al2O3) and amorphous Al2O3 in the soft x-ray region (67–85 eV) around the aluminum LII,III absorption edge (73.1 eV) are determined by angle-dependent x-ray reflectivity. The differences between the optical constant values of both the samples are discussed. The fine structures obtained in the absorption of crystalline sapphire are explained. An absorption feature at 70.2 eV is observed for the first time for crystalline alumina. Both datasets are compared to the tabulated values of Henke et al. [At. Data Nucl. Data Tables 54, 181 (1993)], Weaver et al. [Physik Daten, Physics Data: Optical Properties of Metals (Fach-information zentrum, 1981), Vols. 18-1 and 18-2], and [Handbook of Optical Constants of Solids II (Academic, 1991)].

© 2012 Optical Society of America

OCIS Codes
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(160.0160) Materials : Materials

ToC Category:
Materials

History
Original Manuscript: May 25, 2012
Revised Manuscript: August 22, 2012
Manuscript Accepted: August 24, 2012
Published: October 19, 2012

Citation
Arijeet Das, Rajkumar K. Gupta, Mohammed H. Modi, Chandrachur Mukherjee, Sanjay K. Rai, Aniruddha Bose, Tapas Ganguli, Satish C. Joshi, Gyan S. Lodha, and Sudip K. Deb, "Fine structures in refractive index of sapphire at the LII,III absorption edge of aluminum determined by soft x-ray resonant reflectivity," Appl. Opt. 51, 7402-7410 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-30-7402

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