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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 31 — Nov. 1, 2012
  • pp: 7684–7689

Near-field self-induced hollow spot through localized heating of polycarbonate/ZnS stack layer

Alberto da Costa Assafrao, Arthur J. H. Wachters, Silvania F. Pereira, and H. Paul Urbach  »View Author Affiliations

Applied Optics, Vol. 51, Issue 31, pp. 7684-7689 (2012)

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We have found an alternative way of achieving a doughnutlike focused spot by simply melting a subwavelength scatterer in a polycarbonate/ZnS sample. The near-field microscopy technique is used to directly measure the induced doughnut spot in the near-field regime. A numerical model based on rigorous solution of the Maxwell’s equations is proposed to study the phenomena. The simulations help to understand the optical mechanism behind the spot formation.

© 2012 Optical Society of America

OCIS Codes
(190.0190) Nonlinear optics : Nonlinear optics
(190.4870) Nonlinear optics : Photothermal effects

ToC Category:
Nonlinear Optics

Original Manuscript: September 13, 2012
Manuscript Accepted: October 10, 2012
Published: October 30, 2012

Alberto da Costa Assafrao, Arthur J. H. Wachters, Silvania F. Pereira, and H. Paul Urbach, "Near-field self-induced hollow spot through localized heating of polycarbonate/ZnS stack layer," Appl. Opt. 51, 7684-7689 (2012)

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