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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 34 — Dec. 1, 2012
  • pp: 8211–8215

Reduction of speckle noise in multiwavelength contouring

Claas Falldorf, Silke Huferath-von Luepke, Christoph von Kopylow, and Ralf B. Bergmann  »View Author Affiliations

Applied Optics, Vol. 51, Issue 34, pp. 8211-8215 (2012)

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We report on a method that can be used to improve the result of multiwavelength contouring in the case of objects with rough surface. It is based on the combined evaluation of multiple measurements with varying direction of illumination. While the individual measurements share the same systematics with respect to the shape of the investigated object, the noise arising from speckle decorrelation fluctuates statistically and hence can be reduced by means of averaging. For the case of three illumination directions we show that weighted averaging of the measured phase distributions enhances the signal-to-noise ratio by approximately 3 dB.

© 2012 Optical Society of America

OCIS Codes
(100.2000) Image processing : Digital image processing
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(090.1995) Holography : Digital holography

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: August 29, 2012
Revised Manuscript: November 1, 2012
Manuscript Accepted: November 2, 2012
Published: November 30, 2012

Claas Falldorf, Silke Huferath-von Luepke, Christoph von Kopylow, and Ralf B. Bergmann, "Reduction of speckle noise in multiwavelength contouring," Appl. Opt. 51, 8211-8215 (2012)

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