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Fast algorithm for reliability-guided phase unwrapping in digital holographic microscopy |
Applied Optics, Vol. 51, Issue 36, pp. 8800-8807 (2012)
http://dx.doi.org/10.1364/AO.51.008800
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Abstract
A fast reliability-guided phase unwrapping algorithm, using an optimized quality map and combining it with look-up table operation, is proposed for digital holographic microscopy. First, by detecting the residues in the wrapped phase map, an intensity threshold is calculated in the normalized intensity image and the measured region is distinguished into the reliable region and the doubtful region. An optimized quality map is derived by the method in which the intensity values in the reliable region are set to 1 and those in the doubtful region remain unchanged. Then the flood fill algorithm by look-up table is implemented with the optimized quality map to retrieve true phase map. The experimental results demonstrate that not only does the proposed algorithm perform well, but also the speed is significantly faster than that of the conventional flood fill algorithm using insert sorting.
© 2012 Optical Society of America
OCIS Codes
(100.5070) Image processing : Phase retrieval
(180.6900) Microscopy : Three-dimensional microscopy
(090.1995) Holography : Digital holography
(100.5088) Image processing : Phase unwrapping
ToC Category:
Holography
History
Original Manuscript: August 27, 2012
Revised Manuscript: November 11, 2012
Manuscript Accepted: November 26, 2012
Published: December 20, 2012
Virtual Issues
Vol. 8, Iss. 1 Virtual Journal for Biomedical Optics
Citation
Lihong Ma, Yong Li, Hui Wang, and Hongzhen Jin, "Fast algorithm for reliability-guided phase unwrapping in digital holographic microscopy," Appl. Opt. 51, 8800-8807 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-36-8800
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