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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 5 — Feb. 10, 2012
  • pp: 558–567

Simultaneous wavenumber measurement and coherence detection using temporal phase unwrapping

A. Davila, J. M. Huntley, C. Pallikarakis, P. D. Ruiz, and J. M. Coupland  »View Author Affiliations


Applied Optics, Vol. 51, Issue 5, pp. 558-567 (2012)
http://dx.doi.org/10.1364/AO.51.000558


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Abstract

Wavelength scanning interferometry and swept-source optical coherence tomography require accurate measurement of time-varying laser wavenumber changes. We describe here a method based on recording interferograms of multiple wedges to provide simultaneously high wavenumber resolution and immunity to the ambiguities caused by large wavenumber jumps. All the data required to compute a wavenumber shift are provided in a single image, thereby allowing dynamic wavenumber monitoring. In addition, loss of coherence of the laser light is detected automatically. The paper gives details of the analysis algorithms that are based on phase detection by a two-dimensional Fourier transform method followed by temporal phase unwrapping and correction for optical dispersion in the wedges. A simple but robust method to determine the wedge thicknesses, which allows the use of low-cost optical components, is also described. The method is illustrated with experimental data from a Ti:sapphire tunable laser, including independent wavenumber measurements with a commercial wavemeter. A root mean square (rms) difference in measured wavenumber shift between the two of 4m1 has been achieved, equivalent to an rms wavelength shift error of 0.4pm.

© 2012 Optical Society of America

OCIS Codes
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(300.6190) Spectroscopy : Spectrometers
(300.6320) Spectroscopy : Spectroscopy, high-resolution
(300.6340) Spectroscopy : Spectroscopy, infrared
(100.5088) Image processing : Phase unwrapping

ToC Category:
Spectroscopy

History
Original Manuscript: August 8, 2011
Revised Manuscript: October 24, 2011
Manuscript Accepted: October 25, 2011
Published: February 6, 2012

Virtual Issues
Vol. 7, Iss. 4 Virtual Journal for Biomedical Optics

Citation
A. Davila, J. M. Huntley, C. Pallikarakis, P. D. Ruiz, and J. M. Coupland, "Simultaneous wavenumber measurement and coherence detection using temporal phase unwrapping," Appl. Opt. 51, 558-567 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-5-558


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References

  1. A. Yamamoto and I. Yamaguchi, “Profilometry of sloped plane surfaces by wavelength scanning interferometry,” Opt. Rev. 9, 112–121 (2002). [CrossRef]
  2. A. Yamamoto, C. Kuo, K. Sunouchi, S. Wada, I. Yamaguchi, and H. Tashiro, “Surface shape measurement by wavelength scanning interferometry using an electronically tuned Ti:sapphire Laser,” Opt. Rev. 8, 59–63 (2001). [CrossRef]
  3. P. D. Ruiz, J. M. Huntley, and R. D. Wildman, “Depth-resolved whole-field displacement measurement by wavelength-scanning electronic speckle pattern interferometry,” Appl. Opt. 44, 3945–3953 (2005). [CrossRef]
  4. A. F. Fercher, W Drexler, C. K. Hitzenberger, and T. Lasser, “Optical coherence tomography—principles and applications,” Reps. Prog. Phys. 66, 239–303 (2003).
  5. HSL-1000, Santec Corporation, Aichi, Japan
  6. J. M. Huntley and H. O. Saldner, “Shape measurement by temporal phase unwrapping: comparison of unwrapping algorithms,” Meas. Sci. Technol. 8, 986–992 (1997). [CrossRef]
  7. B. Alipieva, B. Stoykova, and V. Nikolovac, “Wavemeter with Fizean interferometer for CW lasers,” Proc. SPIE 4397, 129–133 (2001). [CrossRef]
  8. L. S. Lee and A. L. Schawlow, “Multiple-wedge wavemeter for pulsed lasers,” Opt. Lett. 6, 610–612 (1981). [CrossRef]
  9. M. Françon, Optical Interferometry (Academic, 1966).
  10. J. M. Huntley, G. H. Kaufmann, and D. Kerr, “Phase-shifted dynamic speckle pattern interferometry at 1 kHz,” Appl. Opt. 38, 6556–6563 (1999). [CrossRef]
  11. M. Takeda, H. Ina, and S. Kobayashi, “Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry,” J. Opt. Soc. Am 72, 156–160 (1982). [CrossRef]
  12. I. H. Malitson, “Interspecimen comparison of the refractive index of fused silica,” J. Opt. Soc. Am. 55, 1205–1208 (1965). [CrossRef]

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