|
Wavelength dispersion measurement of electro-optic coefficients in the range of 520 to 930 nm in rubidium titanyl phosphate using spectral interferometry |
Applied Optics, Vol. 51, Issue 5, pp. 594-599 (2012)
http://dx.doi.org/10.1364/AO.51.000594
Enhanced HTML 
Acrobat PDF (516 KB)
Abstract
Rubidium titanyl phosphate (RTP) is widely used for electro-optical applications at low switching voltages. RTP is nonhygroscopic and does not induce piezoelectric ringing up to the megahertz range. It has large electro-optic (EO) coefficients and a high damage threshold. We present here the EO coefficient wavelength dispersion measurements in the
© 2012 Optical Society of America
OCIS Codes
(050.5080) Diffraction and gratings : Phase shift
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(190.4400) Nonlinear optics : Nonlinear optics, materials
(230.2090) Optical devices : Electro-optical devices
(320.0320) Ultrafast optics : Ultrafast optics
ToC Category:
Thin Films
History
Original Manuscript: October 14, 2011
Manuscript Accepted: November 15, 2011
Published: February 7, 2012
Citation
Olivier Gobert, Nikita Fedorov, Gabriel Mennerat, Dominique Lupinski, Delphine Guillaumet, Michel Perdrix, Antoine Bourgeade, and Michel Comte, "Wavelength dispersion measurement of electro-optic coefficients in the range of 520 to 930 nm in rubidium titanyl phosphate using spectral interferometry," Appl. Opt. 51, 594-599 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-5-594
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
Related Journal Articles 
- Phase-shifting interferometer/ellipsometer capable of measuring the complex index of refraction and the surface profile of a test surface (JOSAA)
- Phase-shifting algorithms for nonlinear and spatially nonuniform phase shifts: reply to comment (JOSAA)
- Simultaneous second-harmonic generation and femtosecond-pulse compression in aperiodically poled KTiOPO4 with a RbTiOAsO4-based optical parametric oscillator (JOSAB)
- Punctuated quadrature phase-shifting interferometry (OL)
- Nonlinear Common-Path Interferometer: An Image Processor (AO)
Related Conference Papers
- Ultrafast nonresonant third-order optical nonlinearities in ZnSe for photonic switching at telecom wavelengths
- Temperature and Composition Dependence of the Absorption and Refraction of Mg-Doped Congruent and Stoichiometric LiNbO3 in the THz Range
- Dispersion-Free Interferometric Autocorrelator for Measurement of Ultra-Broadband Pulses
- All Optical Streak Camera Based on Domain-Engineered Ferroelectric Crystal
- Direct Measurement of Tiled Beam Phase Difference by Multi-Wave Lateral Shearing Interferometry
« Previous Article | Next Article »
OSA is a member of 