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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 8 — Mar. 10, 2012
  • pp: 1131–1136

Optical properties of solution-processable semiconducting TiOx thin films for solar cell and other applications

Jiguang Li, Albert M. DeBerardinis, Lin Pu, and Mool C. Gupta  »View Author Affiliations

Applied Optics, Vol. 51, Issue 8, pp. 1131-1136 (2012)

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The optical properties of solution-processable semiconducting titanium suboxide (TiOx) thin films were investigated as a function of wavelength (350–800 nm) using ellipsometric and optical reflection technique. The variation of refractive index under different thermal annealing conditions (room temperature to 900 °C) was studied. The increase in refractive index with high-temperature thermal annealing process was observed, allowing the opportunity to obtain refractive index values from 1.77 to 2.57 at a wavelength of 600 nm. The x-ray diffraction and atomic force microscopy studies indicate that the index variation is due to the TiOx phase, density, and morphology changes under thermal annealing. The TiOx thin films have applications in organic and inorganic solar cells as well as other optical and photonic devices. We show that TiOx thin films can be used as an effective antireflection layer for Si solar cells.

© 2012 Optical Society of America

OCIS Codes
(040.5350) Detectors : Photovoltaic
(310.0310) Thin films : Thin films
(310.1210) Thin films : Antireflection coatings
(310.3840) Thin films : Materials and process characterization
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Thin Films

Original Manuscript: August 29, 2011
Revised Manuscript: January 9, 2012
Manuscript Accepted: January 10, 2012
Published: March 7, 2012

Jiguang Li, Albert M. DeBerardinis, Lin Pu, and Mool C. Gupta, "Optical properties of solution-processable semiconducting TiOx thin films for solar cell and other applications," Appl. Opt. 51, 1131-1136 (2012)

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