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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 8 — Mar. 10, 2012
  • pp: 1162–1170

Three-dimensional measuring technique for surface topography using a light-sectioning microscope

Linglin Xia, Peifeng Chen, Ying Wang, Le Zhou, and Xi Luo  »View Author Affiliations


Applied Optics, Vol. 51, Issue 8, pp. 1162-1170 (2012)
http://dx.doi.org/10.1364/AO.51.001162


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Abstract

Three-dimensional (3D) surface topographic analysis, measurement, and assessment techniques have raised great interest not only among researchers but also among industrial users. Many industrial processes and applications are directly influenced by the small-scale roughness of surface finishes. This paper describes the development and implementation of a noncontact, three-dimensional, microtopography measuring system. The instrument is formed by combining a modified light-sectioning microscope subsystem with a computer subsystem. In particular, optical system characteristics of the light-sectioning microscope are investigated, and a textured steel sheet is measured to demonstrate good practical outcomes. Details of measuring processes and image processing algorithms are provided, such as procedures for measurement, image edge extraction, and 3D topography reconstruction. After the 3D topography of the measured surface has been reconstructed, the topography field description parameters are calculated. A standard roughness block was used for calibration of the surface microtopography measuring system. Results obtained showed the measurement method output has good agreement with the actual asperity (unevenness or roughness) of the surface. The computer subsystem is used to process and control asperity measurements and image generation, and for image acquisition and presentation.

© 2012 Optical Society of America

OCIS Codes
(110.0180) Imaging systems : Microscopy
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(120.6660) Instrumentation, measurement, and metrology : Surface measurements, roughness

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: September 28, 2011
Revised Manuscript: December 13, 2011
Manuscript Accepted: December 13, 2011
Published: March 8, 2012

Virtual Issues
Vol. 7, Iss. 5 Virtual Journal for Biomedical Optics

Citation
Linglin Xia, Peifeng Chen, Ying Wang, Le Zhou, and Xi Luo, "Three-dimensional measuring technique for surface topography using a light-sectioning microscope," Appl. Opt. 51, 1162-1170 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-8-1162

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