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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 18 — Jun. 20, 2013
  • pp: 4294–4310

X-ray magneto-optical polarization spectroscopy: an analysis from the visible region to the x-ray regime

M. F. Tesch, M. C. Gilbert, H.-Ch. Mertins, D. E. Bürgler, U. Berges, and C. M. Schneider  »View Author Affiliations


Applied Optics, Vol. 52, Issue 18, pp. 4294-4310 (2013)
http://dx.doi.org/10.1364/AO.52.004294


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Abstract

An ultra-high vacuum compatible multipurpose chamber for magneto-optical reflection and transmission experiments with polarization analysis on magnetic systems is introduced. It is applicable in a broad photon energy range from the visible to the soft x-ray regime and for a wide angular range from grazing to normal incidence. It exploits a novel magnetization device based on rotating permanent magnets, which generates tuneable magnetic fields up to 570 mT in longitudinal, transverse and polar geometry. The unique combination of these features enables the feasibility of all typical magneto-optical spectroscopy techniques as T-MOKE, L-MOKE, P-MOKE, x-ray magneto optical linear dichroism, x-ray magnetic circular dichroism in reflection and Kerr polarization-spectroscopy, which is demonstrated for Co with focus on the Co 3p edges.

© 2013 Optical Society of America

OCIS Codes
(000.3110) General : Instruments, apparatus, and components common to the sciences
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(160.3820) Materials : Magneto-optical materials
(340.6720) X-ray optics : Synchrotron radiation
(340.7480) X-ray optics : X-rays, soft x-rays, extreme ultraviolet (EUV)

ToC Category:
X-ray Optics

History
Original Manuscript: March 22, 2013
Manuscript Accepted: April 24, 2013
Published: June 18, 2013

Citation
M. F. Tesch, M. C. Gilbert, H.-Ch. Mertins, D. E. Bürgler, U. Berges, and C. M. Schneider, "X-ray magneto-optical polarization spectroscopy: an analysis from the visible region to the x-ray regime," Appl. Opt. 52, 4294-4310 (2013)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-52-18-4294


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