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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 19 — Jul. 1, 2013
  • pp: 4477–4482

Spectroscopic method for measuring refractive index

Milan Milosevic and Sean W. King  »View Author Affiliations

Applied Optics, Vol. 52, Issue 19, pp. 4477-4482 (2013)

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A method for routine, but precise measurements of refractive index is described. The method is fast and accurate. It is based on the analysis of interference fringes, and uses positions of the fringe maxima and/or minima and a precise measurement of sample thickness to extract refractive index. An extremely dense dataset of refractive index values over the entire spectral range of interest can be routinely obtained.

© 2013 Optical Society of America

OCIS Codes
(160.4670) Materials : Optical materials
(160.6000) Materials : Semiconductor materials
(300.6300) Spectroscopy : Spectroscopy, Fourier transforms
(300.6340) Spectroscopy : Spectroscopy, infrared

ToC Category:

Original Manuscript: April 15, 2013
Revised Manuscript: May 27, 2013
Manuscript Accepted: May 28, 2013
Published: June 24, 2013

Milan Milosevic and Sean W. King, "Spectroscopic method for measuring refractive index," Appl. Opt. 52, 4477-4482 (2013)

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