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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 19 — Jul. 1, 2013
  • pp: 4590–4595

Analytical estimations for the reference wavelength reflectance and width of high reflection zone of two-material periodic multilayers

Tatiana V. Amotchkina  »View Author Affiliations


Applied Optics, Vol. 52, Issue 19, pp. 4590-4595 (2013)
http://dx.doi.org/10.1364/AO.52.004590


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Abstract

Periodic multilayer structures of quarterwave and multiple quarterwave stacks with shifted ratios of high and low index layers in the half-wave pairs are considered. Analytical dependencies of the reference wavelength reflectance and the width of high reflectance zone on the number of layers, fraction quarterwave and layer refractive indices are obtained. The structures are used as starting designs for notch filters. Obtained dependencies allow one to estimate in advance parameters required to achieve target spectral characteristics.

© 2013 Optical Society of America

OCIS Codes
(310.4165) Thin films : Multilayer design
(310.5696) Thin films : Refinement and synthesis methods
(310.6805) Thin films : Theory and design

ToC Category:
Thin Films

History
Original Manuscript: April 4, 2013
Revised Manuscript: May 29, 2013
Manuscript Accepted: May 29, 2013
Published: June 26, 2013

Citation
Tatiana V. Amotchkina, "Analytical estimations for the reference wavelength reflectance and width of high reflection zone of two-material periodic multilayers," Appl. Opt. 52, 4590-4595 (2013)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-52-19-4590


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