Periodic multilayer structures of quarterwave and multiple quarterwave stacks with shifted ratios of high and low index layers in the half-wave pairs are considered. Analytical dependencies of the reference wavelength reflectance and the width of high reflectance zone on the number of layers, fraction quarterwave and layer refractive indices are obtained. The structures are used as starting designs for notch filters. Obtained dependencies allow one to estimate in advance parameters required to achieve target spectral characteristics.
© 2013 Optical Society of America
Original Manuscript: April 4, 2013
Revised Manuscript: May 29, 2013
Manuscript Accepted: May 29, 2013
Published: June 26, 2013
Tatiana V. Amotchkina, "Analytical estimations for the reference wavelength reflectance and width of high reflection zone of two-material periodic multilayers," Appl. Opt. 52, 4590-4595 (2013)