OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 19 — Jul. 1, 2013
  • pp: 4652–4662

Harnessing spectral property of dual wavelength white LED to improve vertical scanning interferometry

Wee Keat Chong, Xiang Li, and Yeng Chai Soh  »View Author Affiliations


Applied Optics, Vol. 52, Issue 19, pp. 4652-4662 (2013)
http://dx.doi.org/10.1364/AO.52.004652


View Full Text Article

Enhanced HTML    Acrobat PDF (1945 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

Unlike a conventional white light source that emits a continuous and broad spectrum of light, the dual wavelength white light emitting diode (LED) generates white light by mixing blue and yellow lights, so there are two distinct peaks in its intensity spectrum. Prior works had shown that the spectral property of the dual wavelength white LED can affect the vertical scanning interferometry negatively if the spectral effects are not compensated. In this paper, we shall examine this issue by modeling the spectral property and variation of the dual wavelength white LED, followed by investigating its effects on the interference signal of vertical scanning interferometry. Instead of compensating the spectral effects of the dual wavelength white LED, we harness its spectral property to improve the performance of a phase-based height reconstruction algorithm in vertical scanning interferometry.

© 2013 Optical Society of America

OCIS Codes
(100.2650) Image processing : Fringe analysis
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: March 20, 2013
Revised Manuscript: May 6, 2013
Manuscript Accepted: May 20, 2013
Published: June 27, 2013

Citation
Wee Keat Chong, Xiang Li, and Yeng Chai Soh, "Harnessing spectral property of dual wavelength white LED to improve vertical scanning interferometry," Appl. Opt. 52, 4652-4662 (2013)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-52-19-4652


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. K. Hanhijärvi, I. Kassamakov, V. Heikkinen, J. Aaltonen, L. Sainiemi, K. Grigoras, S. Franssila, and E. Hæggström, “Stroboscopic supercontinuum white-light interferometer for MEMS characterization,” Opt. Lett. 37, 1703–1705 (2012). [CrossRef]
  2. D. Reolon, M. Jacquot, I. Verrier, G. Brun, and C. Veillas, “Broadband supercontinuum interferometer for high-resolution profilometry,” Opt. Express 14, 128–137 (2006). [CrossRef]
  3. I. Kassamakov, K. Hanhijärvi, I. Abbadi, J. Aaltonen, H. Ludvigsen, and E. Hæggström, “Scanning white-light interferometry with a supercontinuum source,” Opt. Lett. 34, 1582–1584 (2009). [CrossRef]
  4. W. K. Chong, X. Li, and S. Wijesoma, “Effects of phosphor-based LEDs on vertical scanning interferometry,” Opt. Lett. 35, 2946–2948 (2010). [CrossRef]
  5. V. Heikkinen, J. Aaltonen, I. Kassamakov, B. Wälchli, H. Räikkönen, T. Paulin, and E. Hæggström, “Non-phosphor white LED light source for interferometry,” Proc. SPIE 8133, 813309 (2011). [CrossRef]
  6. V. Heikkinen, K. Hanhijärvi, J. Aaltonen, H. Räikkönen, B. Wälchli, T. Paulin, I. Kassamakov, K. Grigoras, S. Franssila, and E. Hæggström, “Hybrid light source for scanning white light interferometry-based MEMS quality control,” Proc. SPIE 8082, 80822O (2011). [CrossRef]
  7. S. Muthu, F. J. P. Schuurmans, and M. D. Pashley, “Red, green, and blue LEDs for white light illumination,” IEEE J. Sel. Top. Quantum Electron. 8, 333–338 (2002). [CrossRef]
  8. G. S. Kino and S. S. C. Chim, “Mirau correlation microscope,” Appl. Opt. 29, 3775–3783 (1990). [CrossRef]
  9. S. S. C. Chim and G. S. Kino, “Correlation microscope,” Opt. Lett. 15, 579–581 (1990). [CrossRef]
  10. P. de Groot and X. C. de Lega, “Signal modeling for low-coherence height-scanning interference microscopy,” Appl. Opt. 43, 4821–4830 (2004). [CrossRef]
  11. W. Walter, “Determination of correlated color temperature based on a color-appearance model,” Color Res. Appl. 17, 24–30 (1992). [CrossRef]
  12. R. Paschotta, Encyclopedia of Laser Physics and Technology (Wiley-VCH, 2008).
  13. “LEDs Magazine—NEMA publishes white-LED binning standard (SSL 3-2010),” http://www.ledsmagazine.com/news/7/4/17 .
  14. “NEMA SSL 3—High-Power White LED Binning for General Illumination,” (2011).
  15. K. Hanhijärvi, J. Aaltonen, I. Kassamakov, K. Grigoras, L. Sainiemi, S. Franssila, and E. Hæggström, “Effect of LED spectral shift on vertical resolution in stroboscopic whitelight interferometry,” Proc. SPIE 7003, 70031S (2008). [CrossRef]
  16. E. Jung, J. H. Ryu, C. H. Hong, and H. Kim, “Optical degradation of phosphor-converted white GaN-based light-emitting diodes under electro-thermal stress,” J. Electrochem. Soc. 158, H132–H136 (2011). [CrossRef]
  17. C. M. E. Tan, B. K. Chen, G. Xu, and Y. Liu, “Analysis of humidity effects on the degradation of high-power white LEDs,” Microelectron. Reliab. 49, 1226–1230 (2009). [CrossRef]
  18. M. Meneghini, L. Trevisanello, C. Sanna, G. Mura, M. Vanzi, G. Meneghesso, and E. Zanoni, “High temperature electro-optical degradation of InGaN/GaN HBLEDs,” Microelectron. Reliab. 47, 1625–1629 (2007). [CrossRef]
  19. “Thermally activated degradation of phosphor-converted white LEDs—LED professional—LED lighting technology,” IEEE Ind. Mag. (February 1, 2010).
  20. W. K. Chong, X. Li, and S. Yeng Chai, “Spectral effects of dual wavelength low coherence light source in white light interferometry,” Opt. Lasers Eng. 51, 651–655 (2013). [CrossRef]
  21. M. E. Pawlowski, Y. Sakano, Y. Miyamoto, and M. Takeda, “Phase-crossing algorithm for white-light fringes analysis,” Opt. Commun. 260, 68–72 (2006). [CrossRef]
  22. M. E. Pawlowski, Y. Sakano, Y. Miyamoto, and M. Takeda, “Phase-crossing algorithm for white-light fringe analysis,” in Pacific Rim Conference on Lasers and Electro-Optics, 2005. CLEO/Pacific Rim 2005 (IEEE, 2005), pp. 1691–1692.
  23. M. Takeda, H. Ina, and S. Kobayashi, “Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry,” J. Opt. Soc. Am. 72, 156–160 (1982). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited