Simple method to obtain accurate pretilt angles for thin twisted nematic liquid-crystal cells

Sheng-Ya Wang; Kei-Hsiung Yang

doi:10.1364/AO.52.000219

Applied Optics
Vol. 52,
Issue 2,
pp. 219-225
(2013)
•https://doi.org/10.1364/AO.52.000219

Simple method to obtain accurate pretilt angles for thin twisted nematic liquid-crystal cells

Sheng-Ya Wang and Kei-Hsiung Yang

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Sheng-Ya Wang and Kei-Hsiung Yang, "Simple method to obtain accurate pretilt angles for thin twisted nematic liquid-crystal cells," Appl. Opt. 52, 219-225 (2013)

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Abstract

Modern thin-film-transistor-driven twisted nematic (TN) products on the market require thin cell gaps below the value to satisfy the condition of the Gooch–Tarry first minimum in transmission for fast response times and wide viewing angles. For the first time to our knowledge, we have developed a simple experimental method based on a new configuration of out-of-plane cell rotation and analyzed our data by extended Jones matrix method to obtain accurate pretilt angles for such thin TN cells where the well-accepted configuration of the out-of-plane cell rotation method analyzed by Birecki and Kahn [The Physics and Chemistry of Liquid Crystal Devices (1980), p. 115] was insufficient to address.

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Refractive Index		Cell Gap (μm)	Twist Angle(°)
$n_{e}$	1.606	3.3	$90 (- 45 \sim 45)$
$n_{o}$	1.485	3.3	$90 (- 45 \sim 45)$
Wavelength $λ$ (nm)		590

Sample	Pretilt Angle (°) Measured by Our Method	Pretilt Angle (°) Measured by Birecki’s Method
A (TN high pretilt)	$4.95 \pm 0.1$	$5.70 \pm 0.1$
B (TN high pretilt)	$5.0 \pm 0.1$	$5.93 \pm 0.1$
E (TN low pretilt)	$2.8 \pm 0.005$	$3.31 \pm 0.05$
F (TN low pretilt)	$2.9 \pm 0.05$	$3.34 \pm 0.05$

Sample	Pretilt Angle (°) Measured by Scheffer and Nehring’s Method
C (Homo. cell high pretilt)	$4.99 \pm 0.002$
D (Homo. cell high pretilt)	$4.93 \pm 0.03$
G (Homo. cell low pretilt)	$2.95 \pm 0.05$
H (Homo. cell low pretilt)	$2.95 \pm 0.03$

Refractive Index		Cell Gap (μm)	Twist Angle(°)
$n_{e}$	1.606	3.3	$90 (- 45 \sim 45)$
$n_{o}$	1.485	3.3	$90 (- 45 \sim 45)$
Wavelength $λ$ (nm)		590

Sample	Pretilt Angle (°) Measured by Our Method	Pretilt Angle (°) Measured by Birecki’s Method
A (TN high pretilt)	$4.95 \pm 0.1$	$5.70 \pm 0.1$
B (TN high pretilt)	$5.0 \pm 0.1$	$5.93 \pm 0.1$
E (TN low pretilt)	$2.8 \pm 0.005$	$3.31 \pm 0.05$
F (TN low pretilt)	$2.9 \pm 0.05$	$3.34 \pm 0.05$

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Applied Optics