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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 2 — Jan. 10, 2013
  • pp: 226–230

Method for accurate measurement of wideband transmittance of thin-film coatings at large angle of incidence

Yongli Liu, Jinlong Zhang, Xinbin Cheng, and Zhanshan Wang  »View Author Affiliations

Applied Optics, Vol. 52, Issue 2, pp. 226-230 (2013)

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Accurate directional transmittance can reduce uncertainty in parameters regression of optical thin-films. When directional transmittance is measured at large angle of incidence (AOI), a polarizer has to be used to produce linearly polarized light and it also becomes an error source. This study presents a method for accurate measurement of wideband transmittance at large AOI, which is aimed to eliminate the polarization error in measured transmittance at oblique incidence. Using this method, we can measure the directional transmittance with a good precision if a partially polarized incident beam is provided. This method reduces the requirement for the performance of the polarizer, and will find application in the highly integrated spectrophotometers.

© 2013 Optical Society of America

OCIS Codes
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(310.5448) Thin films : Polarization, other optical properties
(310.6188) Thin films : Spectral properties

ToC Category:
Thin Films

Original Manuscript: July 23, 2012
Revised Manuscript: December 4, 2012
Manuscript Accepted: December 5, 2012
Published: January 9, 2013

Yongli Liu, Jinlong Zhang, Xinbin Cheng, and Zhanshan Wang, "Method for accurate measurement of wideband transmittance of thin-film coatings at large angle of incidence," Appl. Opt. 52, 226-230 (2013)

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  1. W. V. Goodell, J. K. Coulter, and P. B. Johnson, “Derivation of optical constants of metals from thin-film measurements at oblique incidence,” Appl. Opt. 11, 643–651 (1972). [CrossRef]
  2. D. P. Arndt, R. M. A. Azzam, J. M. Bennett, J. P. Borgogno, C. K. Carniglia, W. E. Case, J. A. Dobrowolski, U. J. Gibson, T. T. Hart, F. C. Ho, V. A. Hodgkin, W. P. Klapp, H. A. Macleod, E. Pelletier, and M. K. Purvis, “Multiple determination of the optical constants of thin-film coating materials,” Appl. Opt. 23, 3571–3596 (1984). [CrossRef]
  3. J. A. Dobrowolski, F. C. Ho, and A. Waldorf, “Determination of optical constants of thin-film coating materials based on inverse synthesis,” Appl. Opt. 22, 3191–3200 (1983). [CrossRef]
  4. T. Kihara and K. Yokomori, “Simultaneous measurement of the refractive index and thickness of thin-films by s-polarized reflectances,” Appl. Opt. 31, 4482–4487 (1992). [CrossRef]
  5. K. Lamprecht, W. Papousek, and G. Leising, “Problem of ambiguity in the determination of optical constants of thin absorbing films from spectroscopic reflectance and transmittance measurements,” Appl. Opt. 36, 6364–6371 (1997). [CrossRef]
  6. S. Nevas, F. Manoocheri, E. Ikonen, A. V. Tikhonravov, M. A. Kokarev, and M. K. Trubetskov, “Optical metrology of thin-films using high-accuracy spectro-photometric measurements with oblique angles of incidence,” Proc. SPIE 5250, 234–242 (2004). [CrossRef]
  7. A. Lamminpää, S. Nevas, F. Manoocheri, and E. Ikonen, “Characterization of thin-films based on reflectance and transmittance measurements at oblique angles of incidence,” Appl. Opt. 45, 1392–1396 (2006). [CrossRef]
  8. P. A. van Nijnatten, “Optical analysis of coatings by variable angle spectrophotometry,” Thin Solid Films 516, 4553–4557 (2008). [CrossRef]
  9. L. Gao, F. Lemarchand, and M. Lequime, “Exploitation of multiple incidences spectrometric measurements for thin-film reverse engineering,” Opt. Express 20, 15734–15751(2012). [CrossRef]
  10. A. V. Tikhonravov, T. V. Amotchkina, M. K. Trubetskov, R. Francis, V. Janicki, J. Sancho-Parramon, H. Zorc, and V. Pervak, “Optical characterization and reverse engineering based on multiangle spectroscopy,” Appl. Opt. 51, 245–254 (2012). [CrossRef]
  11. P. A. Van Nijnatten, “An automated directional reflectance/transmittance analyzer for coating analysis,” Thin Solid Films 442, 74–79 (2003). [CrossRef]
  12. M. G. Hutchins and P. Ageorges, “Angular-dependent spectral optical properties of architectural glazings: results of an interlaboratory comparison of measurements,” Proc. SPIE 2017, 13–24 (1993). [CrossRef]
  13. M. G. Hutchins, A. J. Topping, C. Anderson, F. Olive, P. Van Nijnatten, P. Polato, A. Roos, and M. Rubin, “Measurement and prediction of angle-dependent optical properties of coated glass products: results of an inter-laboratory comparison of spectral transmittance and reflectance,” Thin Solid Films 392, 269–275 (2001). [CrossRef]
  14. M. Bass, Handbook of Optics, Volume I (McGraw-Hill, 2010).
  15. A. F. Ryuichi Shintani and C. Kang, Polarized Light (Atomic Energy, 1994).
  16. D. Goldstein and E. Collett, Polarized Light (Marcel Dekker, 2003).
  17. C. Amra, M. Zerrad, L. Siozade, G. Georges, and C. Deumié, “Partial polarization of light induced by random defects at surfaces or bulks,” Opt. Express 16, 10372–10383 (2008). [CrossRef]
  18. M. Zerrad, J. Sorrentini, G. Soriano, and C. Amra, “Gradual loss of polarization in light scattered from rough surfaces: electromagnetic prediction,” Opt. Express 18, 15832–15843 (2010). [CrossRef]

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