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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 20 — Jul. 10, 2013
  • pp: 4890–4897

Improvement of the depth resolution in depth-resolved wavenumber-scanning interferometry using multiple uncorrelated wavenumber bands

Jinxiong Xu, Yufei Liu, Bo Dong, Yulei Bai, Linlin Hu, Cong Shi, Zhuoming Xu, and Yanzhou Zhou  »View Author Affiliations


Applied Optics, Vol. 52, Issue 20, pp. 4890-4897 (2013)
http://dx.doi.org/10.1364/AO.52.004890


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Abstract

In this article, we provide a method to improve the depth resolution of wide-field depth-resolved wavenumber-scanning interferometry (DRWSI), because its depth resolution is limited by the range of the wavenumber scanning and mode hopping of the light source. An optical wedge is put into the optical path to measure the series of the wavenumber on time using a 2D spatial Fourier transform (FT) of the interferograms. Those uncorrelated multiple bands of the wavenumbers due to mode hopping of the diode laser can be synthesized into one band, to enlarge the range of the wavenumber scanning. A random-sampling FT is put forward to evaluate the distribution of frequencies and phases of the multiple surfaces measured. The benefit is that the depth resolution of the DRWSI is enhanced significantly with a higher signal-to-noise ratio. Because of its simplicity and practicability, this method broadens the way to employing multiple different lasers or lasers with mode hopping as the light sources in the DRWSI.

© 2013 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(140.2020) Lasers and laser optics : Diode lasers
(350.5730) Other areas of optics : Resolution

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: December 19, 2012
Revised Manuscript: April 25, 2013
Manuscript Accepted: April 27, 2013
Published: July 5, 2013

Citation
Jinxiong Xu, Yufei Liu, Bo Dong, Yulei Bai, Linlin Hu, Cong Shi, Zhuoming Xu, and Yanzhou Zhou, "Improvement of the depth resolution in depth-resolved wavenumber-scanning interferometry using multiple uncorrelated wavenumber bands," Appl. Opt. 52, 4890-4897 (2013)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-52-20-4890


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