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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 20 — Jul. 10, 2013
  • pp: 4922–4932

Open-loop phase shifting for fast acquisition of interferograms in low light levels

Tyler M. McCracken, Colby A. Jurgenson, Chris A. Haniff, David F. Buscher, John S. Young, and Michelle Creech-Eakman  »View Author Affiliations

Applied Optics, Vol. 52, Issue 20, pp. 4922-4932 (2013)

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Phase shifting interferometry relies on sets of interferograms taken at multiple known phase offsets to deduce the instantaneous phase of a quasi-static fringe pattern. The traditional method for introducing these phase shifts has been either to step a mirror, and measure the fringe pattern at each step, or to scan a mirror, integrating the fringe pattern for discrete time intervals while the fringes “move” on the detector. A stepping mirror eliminates this fringe smear but has typically required a closed-loop controller to ensure that the optical path introduced is accurately known. Furthermore, implementing rapid stepping of a moderately sized optic can prove difficult if the fringe phase needs to be measured on a short time scale. We report results demonstrating very fast (>100Hz) and precise phase shifting using a piezomodulated mirror operated in open-loop without any position feedback. Our method exploits the use of a synthetic driving waveform that is optimized to match the complex frequency response of the modulator and its supported optic. For phase measurements in the near-infrared at 2.15 μm, and with a time between steps as small as 0.2 ms, we report errors below λ/100 in the desired position of our optic, i.e., an effective optical path difference error of λ/55. For applications in near-infrared stellar interferometry, this implies an enhancement in the fringe-tracking sensitivity of roughly 20% (in the photon-limited regime) over that which is conventionally realized using a swept mirror.

© 2013 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.5060) Instrumentation, measurement, and metrology : Phase modulation

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: April 15, 2013
Revised Manuscript: June 6, 2013
Manuscript Accepted: June 6, 2013
Published: July 9, 2013

Tyler M. McCracken, Colby A. Jurgenson, Chris A. Haniff, David F. Buscher, John S. Young, and Michelle Creech-Eakman, "Open-loop phase shifting for fast acquisition of interferograms in low light levels," Appl. Opt. 52, 4922-4932 (2013)

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