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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 24 — Aug. 20, 2013
  • pp: 6051–6062

Comprehensive polarimetric analysis of Spectralon white reflectance standard in a wide visible range

J. M. Sanz, C. Extremiana, and J. M. Saiz  »View Author Affiliations


Applied Optics, Vol. 52, Issue 24, pp. 6051-6062 (2013)
http://dx.doi.org/10.1364/AO.52.006051


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Abstract

Since polarimetry has extended its use for the study of scattering from surfaces and tissues, Spectralon, a white reflectance standard, is acquiring the role of a polarimetric standard. Both the behavior of Spectralon as a Lambertian surface and its performance as a perfect depolarizer are analyzed in detail. The accuracy of our dynamic polarimeter, together with the polar decomposition to describe the Mueller matrix (MM) depolarizing action, combine to produce a powerful tool for the proper analysis of this scattering surface. Results allowed us to revisit, for confirmation or revision, the role of some MM elements, as described in the bibliography. The conditions under which it can be considered a good Lambertian surface are specified in terms of incidence and scattering angle and verified over a large wavelength range.

© 2013 Optical Society of America

OCIS Codes
(290.1483) Scattering : BSDF, BRDF, and BTDF
(290.5855) Scattering : Scattering, polarization
(240.2130) Optics at surfaces : Ellipsometry and polarimetry

ToC Category:
Scattering

History
Original Manuscript: April 12, 2013
Manuscript Accepted: July 25, 2013
Published: August 19, 2013

Citation
J. M. Sanz, C. Extremiana, and J. M. Saiz, "Comprehensive polarimetric analysis of Spectralon white reflectance standard in a wide visible range," Appl. Opt. 52, 6051-6062 (2013)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-52-24-6051


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