Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Selective reflection technique as a probe to monitor the growth of metallic thin film on dielectric surfaces

Not Accessible

Your library or personal account may give you access

Abstract

Controlling thin film formation is technologically challenging. The knowledge of physical properties of the film and of the atoms in the surface vicinity can help improve control over the film growth. We investigate the use of the well-established selective reflection technique to probe the thin film during its growth, simultaneously monitoring the film thickness, the atom–surface van der Waals interaction, and the vapor properties in the surface vicinity.

© 2013 Optical Society of America

Full Article  |  PDF Article
More Like This
Surface plasmon enhanced differential reflectance technique for ultra-thin film monitoring

Ben-Li Wang, Jia-Fang Li, and Zhi-Yuan Li
J. Opt. Soc. Am. B 30(6) 1590-1594 (2013)

Optical real-time monitoring of the laser molecular-beam epitaxial growth of perovskite oxide thin films by an oblique-incidence reflectance-difference technique

Fan Chen, Huibin Lu, Zhenghao Chen, Tong Zhao, and Guozhen Yang
J. Opt. Soc. Am. B 18(7) 1031-1035 (2001)

Investigation of metal sulfide optical thin film growth in low-loss IR hollow glass waveguides

Carlos M. Bledt, Jeffrey E. Melzer, and James A. Harrington
Opt. Mater. Express 3(9) 1397-1407 (2013)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (5)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (3)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved