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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 26 — Sep. 10, 2013
  • pp: 6458–6466

Quality evaluation of spaceborne SiC mirrors (II): evaluation technology for mirror accuracy using actual measurement data of samples cut out from a mirror surface

Masaki Kotani, Tadashi Imai, Haruyoshi Katayama, Yukari Yui, Yoshio Tange, Hidehiro Kaneda, Takao Nakagawa, and Keigo Enya  »View Author Affiliations


Applied Optics, Vol. 52, Issue 26, pp. 6458-6466 (2013)
http://dx.doi.org/10.1364/AO.52.006458


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Abstract

The authors studied the quality evaluation technology of a spaceborne large-scale lightweight mirror that was made of silicon carbide (SiC)-based material. To correlate the material property of a mirror body and the mirror accuracy, the authors evaluated the mirror surface deviation of a prototype mirror by inputting actually measured coefficient of thermal expansion (CTE) data into a finite element analysis model. The CTE data were obtained by thermodilatometry using a commercial grade thermal dilatometer for the samples cut from all over the mirror surface. The computationally simulated contour diagrams well reproduced the mirror accuracy profile that the actual mirror showed in cryogenic testing. Density data were also useful for evaluating the mirror surface deviation because they had a close relationship with the CTE.

© 2013 Optical Society of America

OCIS Codes
(160.4670) Materials : Optical materials
(220.4840) Optical design and fabrication : Testing
(240.6700) Optics at surfaces : Surfaces
(350.4600) Other areas of optics : Optical engineering
(350.6090) Other areas of optics : Space optics

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: June 20, 2013
Revised Manuscript: August 5, 2013
Manuscript Accepted: August 6, 2013
Published: September 3, 2013

Citation
Masaki Kotani, Tadashi Imai, Haruyoshi Katayama, Yukari Yui, Yoshio Tange, Hidehiro Kaneda, Takao Nakagawa, and Keigo Enya, "Quality evaluation of spaceborne SiC mirrors (II): evaluation technology for mirror accuracy using actual measurement data of samples cut out from a mirror surface," Appl. Opt. 52, 6458-6466 (2013)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-52-26-6458


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