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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 27 — Sep. 20, 2013
  • pp: 6840–6848

Three-degree-of-freedom displacement measurement using grating-based heterodyne interferometry

Hung-Lin Hsieh and Ssu-Wen Pan  »View Author Affiliations


Applied Optics, Vol. 52, Issue 27, pp. 6840-6848 (2013)
http://dx.doi.org/10.1364/AO.52.006840


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Abstract

A heterodyne grating-based interferometer for three-degree-of-freedom (3-DOF) displacement measurement is proposed. This technique has the merits of both heterodyne interferometry and grating interferometry. A heterodyne light beam is obtained using an electro-optic modulating technique for amplitude modulation. While the heterodyne light beam is normally incident into a transmission-type 2D grating, two detection parts for in-plane and out-of-plane displacement measurements will be obtained. The heterodyne light beam is utilized to carry the optical phase variation that results from grating displacement in three directions. The experimental results demonstrate that the proposed interferometer is capable of sensing the displacement of a motion stage in 3-DOF. The resolution and range of the measurement can achieve up to nanometric and millimetric levels.

© 2013 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3940) Instrumentation, measurement, and metrology : Metrology
(230.1950) Optical devices : Diffraction gratings

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: June 6, 2013
Revised Manuscript: August 9, 2013
Manuscript Accepted: August 29, 2013
Published: September 20, 2013

Citation
Hung-Lin Hsieh and Ssu-Wen Pan, "Three-degree-of-freedom displacement measurement using grating-based heterodyne interferometry," Appl. Opt. 52, 6840-6848 (2013)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-52-27-6840

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