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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 28 — Oct. 1, 2013
  • pp: 6956–6961

Modified Schwarzschild imaging spectrometer with a low F-number and a long slit

Qingsheng Xue  »View Author Affiliations


Applied Optics, Vol. 52, Issue 28, pp. 6956-6961 (2013)
http://dx.doi.org/10.1364/AO.52.006956


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Abstract

A modified Schwarzschild imaging spectrometer utilizing three nonconcentric aspheric mirrors and a plane grating is designed that can handle low F-number, long slit, and broad spectral range. Based on the geometrical aberration theory and Rowland circle condition, the astigmatism-correcting method of the Schwarzschild imaging spectrometer is analyzed. The design procedure of initial parameters is programmed using Matlab software. As an example, a modified Schwarzschild imaging spectrometer operating in 400–1000 nm waveband with F-number of 2.5 and slit length of 13 mm is designed, and good imaging quality is obtained.

© 2013 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.0280) Instrumentation, measurement, and metrology : Remote sensing and sensors
(120.4570) Instrumentation, measurement, and metrology : Optical design of instruments
(300.0300) Spectroscopy : Spectroscopy
(300.6190) Spectroscopy : Spectrometers

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: July 17, 2013
Revised Manuscript: September 2, 2013
Manuscript Accepted: September 4, 2013
Published: September 30, 2013

Citation
Qingsheng Xue, "Modified Schwarzschild imaging spectrometer with a low F-number and a long slit," Appl. Opt. 52, 6956-6961 (2013)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-52-28-6956

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