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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 3 — Jan. 20, 2013
  • pp: 323–329

In situ calibration of an extreme ultraviolet spectrometer for attosecond transient absorption experiments

Xiaowei Wang, Michael Chini, Yan Cheng, Yi Wu, and Zenghu Chang  »View Author Affiliations

Applied Optics, Vol. 52, Issue 3, pp. 323-329 (2013)

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We report a method for calibrating an extreme ultraviolet spectrometer based on a flat-field grazing incidence spherical grating in the energy range of 20–30 eV. By measuring absorption lines corresponding to singly excited states in helium atoms and autoionizing states in argon atoms, the photon energy of the detected light was determined. The spectral resolution of the spectrometer, 60 meV, was obtained by deconvolving the Fano resonance profile of argon autoionizing states from the measured absorption line profiles.

© 2013 Optical Society of America

OCIS Codes
(340.7480) X-ray optics : X-rays, soft x-rays, extreme ultraviolet (EUV)
(020.2649) Atomic and molecular physics : Strong field laser physics

ToC Category:
X-ray Optics

Original Manuscript: October 22, 2012
Manuscript Accepted: December 7, 2012
Published: January 11, 2013

Xiaowei Wang, Michael Chini, Yan Cheng, Yi Wu, and Zenghu Chang, "In situ calibration of an extreme ultraviolet spectrometer for attosecond transient absorption experiments," Appl. Opt. 52, 323-329 (2013)

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