OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 3 — Jan. 20, 2013
  • pp: 509–515

Soft x-ray free-electron laser imaging by LiF crystal and film detectors over a wide range of fluences

Tatiana A. Pikuz, Anatoly Ya. Faenov, Yuji Fukuda, Masaki Kando, Paul Bolton, Alexander Mitrofanov, Alexander V. Vinogradov, Mitsuru Nagasono, Haruhiko Ohashi, Makina Yabashi, Kensuke Tono, Yasunori Senba, Tadashi Togashi, and Tetsuya Ishikawa  »View Author Affiliations


Applied Optics, Vol. 52, Issue 3, pp. 509-515 (2013)
http://dx.doi.org/10.1364/AO.52.000509


View Full Text Article

Enhanced HTML    Acrobat PDF (795 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

LiF crystal and film detectors were used to measure the far-field fluence profile of a self-amplified spontaneous-emission free-electron laser beam and diffraction imaging with high spatial resolution. In these measurements the photoluminescence (PL) response of LiF crystal and film was compared over a wide range of soft x-ray fluences. It was found that the soft x-ray fluence dependences of LiF crystal and film differ. At low fluence, the LiF crystal shows higher PL response compared to LiF film, while this comparison is the opposite at higher fluence. Accurate measurement of LiF crystal and film PL response is important for precise characterization of the spatial, spectral, and coherence features of x-ray beams across the full profile and in localized areas. For such measurements, crucial LiF detector attributes are high spatial resolution and high dynamic range.

© 2013 Optical Society of America

OCIS Codes
(110.7440) Imaging systems : X-ray imaging
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(140.7240) Lasers and laser optics : UV, EUV, and X-ray lasers

ToC Category:
X-ray Optics

History
Original Manuscript: August 2, 2012
Revised Manuscript: December 16, 2012
Manuscript Accepted: December 20, 2012
Published: January 18, 2013

Citation
Tatiana A. Pikuz, Anatoly Ya. Faenov, Yuji Fukuda, Masaki Kando, Paul Bolton, Alexander Mitrofanov, Alexander V. Vinogradov, Mitsuru Nagasono, Haruhiko Ohashi, Makina Yabashi, Kensuke Tono, Yasunori Senba, Tadashi Togashi, and Tetsuya Ishikawa, "Soft x-ray free-electron laser imaging by LiF crystal and film detectors over a wide range of fluences," Appl. Opt. 52, 509-515 (2013)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-52-3-509


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. I. C. E. Turcu and J. B. Dance, X-rays from Laser Plasmas(Wiley, 1998).
  2. D. Attwood, Soft X Rays and Extreme Ultraviolet Radiation: Principle and Application (Cambridge University, 2007).
  3. S. Suckewer and P. Jaegle, “X-ray laser: past, present and future,” Laser Phys. Lett. 6, 411–436 (2009). [CrossRef]
  4. M. Praeger, A. M. De Paula, C. A. Froud, E. T. F. Rogers, S. L. Stebbings, W. S. Brocklesby, J. J. Baumberg, D. C. Hanna, and J. G. Frey, “Spatially resolved soft X-ray spectrometry from single-image diffraction,” Nat. Phys. 3, 176–179 (2007). [CrossRef]
  5. I. A. Vartanyants, A. P. Mancuso, A. Singer, O. M. Yefanov, and J. Gulden, “Coherence measurements and coherent diffractive imaging at FLASH,” J. Phys. B 43, 194016 (2010). [CrossRef]
  6. M. Berrill, D. Alessi, Y. Wang, S. R. Domingue, D. H. Martz, B. M. Luther, Y. Liu, and J. J. Rocca, “Improved beam characteristics of solid-target soft x-ray laser amplifiers by injection seeding with high harmonic pulses,” Opt. Lett. 35, 2317–2319 (2010). [CrossRef]
  7. H. N. Chapman and K. A. Nugent, “Coherent lensless X-ray imaging,” Nat. Photonics 4, 833–839 (2010). [CrossRef]
  8. T. Suemoto, K. Terakawa, Y. Ochi, T. Tomita, M. Yamamoto, N. Hasegawa, M. Deki, Y. Minami, and T. Kawachi, “Single-shot picosecond interferometry with one-nanometer resolution for dynamical surface morphology using a soft x-ray laser,” Opt. Express 18, 14114–14122 (2010). [CrossRef]
  9. G. Baldacchini, F. Bonfigli, F. Flora, R. M. Montereali, D. Murra, E. Nichelatti, A. Y. Faenov, and T. A. Pikuz, “High-contrast photoluminescent patterns in lithium fluoride crystals produced by soft x rays from a laser-plasma source,” Appl. Phys. Lett. 80, 4810–4812 (2002). [CrossRef]
  10. G. Baldacchini, F. Bonfigli, A. Faenov, F. Flora, R. M. Montereali, A. Pace, T. Pikuz, and L. Reale, “Lithium fluoride as a novel x-ray image detector for biological μ-world capture,” J. Nanosci. Nanotechnol. 3, 483–486 (2003). [CrossRef]
  11. G. Tomassetti, A. Ritucci, A. Reale, L. Palladino, L. Reale, L. Arrizza, G. Baldacchini, F. Bonfigli, F. Flora, L. Mezi, R. M. Montereali, S. V. Kukhlevsky, A. Faenov, T. Pikuz, and J. Kaiser, “High-resolution imaging of a soft x-ray laser beam by color centers excitation in lithium fluoride crystals,” Europhys. Lett. 63, 681–686 (2003). [CrossRef]
  12. K. Kawamura, M. Hirano, T. Kurobori, D. Takamizu, T. Kamiya, and H. Hosono, “Femtosecond-laser-encoded distributed-feedback color center laser in lithium fluoride single crystals,” Appl. Phys. Lett. 84, 311–313 (2004). [CrossRef]
  13. L. C. Courrol, R. E. Samad, L. Gomes, I. M. Ranieri, S. L. Baldochi, A. Z. de Freitas, and N. D. Vieira, “Color center production by femtosecond pulse laser irradiation in LiF crystals,” Opt. Express 12, 288–293 (2004). [CrossRef]
  14. G. Baldacchini, S. Bollanti, F. Bonfigli, F. Flora, P. Di Lazzaro, A. Lai, T. Marolo, R. M. Montereali, D. Murra, A. Faenov, T. Pikuz, N. Lisi, G. Tomassetti, A. Reale, L. Reale, A. Ritucci, T. Limongi, L. Palladino, M. Francucci, S. Martelluci, and G. Petrocelli, “Submicron soft x-ray imaging detectors based on LiF crystals and films: characterization and applications,” Rev. Sci. Instrum. 76, 113104 (2005). [CrossRef]
  15. F. Bonfigli, A. Faenov, F. Flora, T. Marolo, R. M. Montereali, E. Nichelatti, T. Pikuz, L. Reale, and G. Baldacchini, “Point defects in lithium fluoride films for micro-radiography, x-ray microscopy and photonic applications,” Phys. Status Solidi A 202, 250–255 (2005). [CrossRef]
  16. A. Ustione, A. Cricenti, F. Bonfigli, F. Flora, A. Lai, T. Marolo, R. M. Montereali, G. Baldacchini, A. Faenov, T. Pikuz, and L. Reale, “Scanning near-field optical microscopy images of microradiographs stored in lithium fluoride films with an optical resolution of λ/12,” Appl. Phys. Lett. 88, 141107 (2006). [CrossRef]
  17. K. Kawamura, M. Hirano, T. Kamiya, and H. Hosono, “Femtosecond-leaser-encoded distributed-feedback color center laser in lithium fluoride single crystal,” J. Non-Cryst. Solids 352, 2347–2350 (2006). [CrossRef]
  18. F. Calegari, G. Valentini, C. Vozzi, E. Benedetti, J. Cabanillas-Gonzalez, A. Faenov, S. Gasilov, T. Pikuz, L. Poletto, G. Sansone, P. Villoresi, M. Nisoli, S. De Silvestri, and S. Stagira, “Elemental sensitivity in soft x-ray imaging with a laser-plasma source and color center detector,” Opt. Lett. 32, 2593–2595 (2007). [CrossRef]
  19. F. Bonfigli, A. Faenov, F. Flora, M. Francucci, P. Gaudio, A. Lai, S. Martellucci, R. M. Montereali, T. Pikuz, L. Reale, M. Richetta, M. A. Vincenti, and G. Baldacchini, “High-resolution water window x-ray imaging of in vivo cells and their products using LiF crystal detectors,” Microsc. Res. Tech. 71, 35–41 (2008). [CrossRef]
  20. Y. Fukuda, A. Y. Faenov, T. Pikuz, M. Kando, H. Kotaki, I. Daito, J. Ma, L. M. Chen, T. Homma, K. Kawase, T. Kameshima, T. Kawachi, H. Daido, T. Kimura, T. Tajima, Y. Kato, and S. V. Bulanov, “Soft x-ray source for nanostructure imaging using femtosecond-laser-irradiated clusters,” Appl. Phys. Lett. 92, 121110 (2008). [CrossRef]
  21. T. Kurobori, Y. Obayashi, K. Suzuki, Y. Hirose, T. Sakai, and S. Aoshima, “Fabrication of optoelectronic devices in lithium fluoride crystals by interfering femtosecond laser pulses,” Jpn. J. Appl. Phys. 47, 685–688 (2008). [CrossRef]
  22. A. Y. Faenov, Y. Kato, M. Tanaka, T. A. Pikuz, M. Kishimoto, M. Ishino, M. Nishikino, Y. Fukuda, S. V. Bulanov, and T. Kawachi, “Submicrometer-resolution in situ imaging of the focus pattern of a soft x-ray laser by color center formation in LiF crystal,” Opt. Lett. 34, 941 (2009). [CrossRef]
  23. T. A. Pikuz, A. Y. Faenov, S. V. Gasilov, I. Y. Skobelev, Y. Fukuda, M. Kando, H. Kotaki, T. Homma, K. Kawase, Y. Hayahsi, T. Kawachi, H. Daido, Y. Kato, and S. Bulanov, “Propagation-based phase-contrast enhancement of nanostructure images using a debris-free femtosecond-laser-driven cluster-based plasma soft x-ray source and an LiF crystal detector,” Appl. Opt. 48, 6271–6276 (2009). [CrossRef]
  24. S. V. Gasilov, A. Y. Faenov, T. A. Pikuz, Y. Fukuda, M. Kando, T. Kawachi, I. Y. Skobelev, H. Daido, Y. Kato, and S. V. Bulanov, “Wide field of view phase contrast imaging of nanostructures with a comparatively large polychromatic soft X-ray plasma source,” Opt. Lett. 34, 3268–3270 (2009). [CrossRef]
  25. X. Wang, B. Mu, L. Jiang, J. Zhu, S. Yi, Z. Wang, and P. He, “Fabrication of nanoscale patterns in lithium fluoride crystal using a 13.5 nm Schwarzschild objective and a laser produced plasma source,” Rev. Sci. Instrum. 82, 123702 (2011). [CrossRef]
  26. T. Pikuz, A. Faenov, Y. Fukuda, M. Kando, P. Bolton, A. Mitrofanov, A. Vinogradov, M. Nagasono, H. Ohashi, M. Yabashi, K. Tono, Y. Senba, T. Togashi, and T. Ishikawa, “Optical features of a LiF crystal soft x-ray imaging detector irradiated by free electron laser pulses,” Opt. Express 20, 3424–3433 (2012). [CrossRef]
  27. T. Kurobori, T. Yamakage, Y. Hirose, K. Kawamura, M. Hirano, and H. Hosono, “Application of wide-band-gap materials for optoelectronic functional devices fabricated by a pair of interfering femtosecond laser pulses,” Jpn. J. Appl. Phys. 44, 910–913 (2005). [CrossRef]
  28. G. Baldacchini, S. Bollanti, F. Bonfigli, P. Di Lazzaro, A. Y. Faenov, F. Flora, T. Marolo, R. M. Montereali, D. Murra, E. Nichelatti, T. Pikuz, A. Reale, L. Reale, A. Ritucci, and G. Tomassetti, “Point defects in lithium fluoride by EUV and soft X-rays exposure for X-ray microscopy and optical applications,” IEEE J. Sel. Top. Quantum Electron. 10, 1435–1445 (2004). [CrossRef]
  29. G. Baldacchini, M. Cremona, G. d’Auria, S. Martelli, R. M. Montereali, M. Montecchi, E. Burattini, A. Grilli, and A. Race, “Influence of LiF film growth conditions on electron induced color center formation,” Nucl. Instrum. Methods Phys. Res. B 116, 447–451 (1996). [CrossRef]
  30. E. Nichelatti and R. M. Montereali, “Photoluminescence from a homogeneous volume source within an optical multilayer: analytical formulas,” J. Opt. Soc. Am. A 29. 303–312 (2012). [CrossRef]
  31. T. Inagaki, S. Imoue, M. Ishi, Y. Kim, H. Kimura, M. Kitamura, T. Kobayashi, H. Maesaka, T. Masuda, S. Matsui, T. Matsushita, X. Marechal, M. Nagasono, H. Ohashi, T. Ohata, T. Ohshima, K. Onoe, K. Shirasawa, T. Takagi, S. Takahashi, M. Takeuchi, K. Tamasaku, R. Tanaka, Y. Tanaka, T. Tanikawa, T. Togashi, S. Wu, A. Yamashita, K. Yanagida, C. Zhang, H. Kitamura, and T. Ishikawa, “A compact free-electron laser for generating coherent radiation in the extreme ultraviolet region,” Nat. Photonics 2, 555–559 (2008). [CrossRef]
  32. M. Kato, N. Saito, T. Tanaka, Y. Morishita, H. Kimura, H. Ohashi, M. Nagasono, M. Yabashi, K. Tono, T. Togashi, A. Higashiya, and T. Ishikawa, “Pulse energy of the extreme-ultraviolet free-electron laser at SPring-8 determined using a cryogenic radiometer,” Nucl. Instrum. Methods Phys. Res. A 612, 209–211 (2009). [CrossRef]
  33. The Center for X-Ray Optics, “X-ray interactions with matter,” http://henke.lbl.gov/optical_constants .
  34. D. M. Paganin, Coherent X-Ray Optics (Oxford University, 2006).

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited