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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 31 — Nov. 1, 2013
  • pp: 7654–7659

Phase- and tilt-shift determinations by analysis of spectra sidebands for phase-shift interferometers

Qian Liu, Yang Wang, Fang Ji, and Jianguo He  »View Author Affiliations

Applied Optics, Vol. 52, Issue 31, pp. 7654-7659 (2013)

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A spatial frequency domain method is presented to deal with tilt-shift errors and random phase shift in temporal phase-shift interferometry. The proposed method determines tilt shift and phase shift by analyzing positions and phase variances of sidebands in spatial frequency domain. The method is computationally fast for it is noniterative and needs only one 2D Fourier transform for each spatial carrier interferogram. No initial estimations are required and no ambiguous results are generated with the proposed method. Simulations indicate that the proposed method could detect tilt shift and piston phase shift with high accuracy. Results of experiments conducted in the presence of vibration demonstrate that the proposed method could alleviate fluctuations in the retrieved phase map. The method could be applied to interferometers that are uncalibrated or with an unbalanced piezoelectric transducer, besides interferometers in unsteady conditions.

© 2013 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5060) Instrumentation, measurement, and metrology : Phase modulation
(120.7280) Instrumentation, measurement, and metrology : Vibration analysis

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: August 21, 2013
Revised Manuscript: October 9, 2013
Manuscript Accepted: October 10, 2013
Published: October 31, 2013

Qian Liu, Yang Wang, Fang Ji, and Jianguo He, "Phase- and tilt-shift determinations by analysis of spectra sidebands for phase-shift interferometers," Appl. Opt. 52, 7654-7659 (2013)

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