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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 32 — Nov. 10, 2013
  • pp: 7718–7723

Nonlinear calibration for generalized fringe projection profilometry under large measuring depth range

Feipeng Zhu, Hongjian Shi, Pengxiang Bai, Dong Lei, and Xiaoyuan He  »View Author Affiliations


Applied Optics, Vol. 52, Issue 32, pp. 7718-7723 (2013)
http://dx.doi.org/10.1364/AO.52.007718


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Abstract

A mathematical description of the absolute surface height distribution in generalized fringe projection profilometry under large measuring depth range is presented. Based on least-squares polynomial fitting, a nonlinear calibration to determine the mapping between phase change and surface height is proposed by considering the unequal height arrangement of the projector and the camera. To solve surface height from phase change, an iteration method is brought forward. Experiments are implemented to demonstrate the validity of the proposed calibration and an accuracy of 0.3 mm for surface profile under 300 mm measuring depth can be achieved.

© 2013 Optical Society of America

OCIS Codes
(100.2650) Image processing : Fringe analysis
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(150.1488) Machine vision : Calibration

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: October 16, 2013
Revised Manuscript: October 16, 2013
Manuscript Accepted: October 16, 2013
Published: November 6, 2013

Citation
Feipeng Zhu, Hongjian Shi, Pengxiang Bai, Dong Lei, and Xiaoyuan He, "Nonlinear calibration for generalized fringe projection profilometry under large measuring depth range," Appl. Opt. 52, 7718-7723 (2013)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-52-32-7718

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