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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 34 — Dec. 1, 2013
  • pp: 8381–8387

Analysis of misalignment-induced measurement error for goniophotometry of light-emitting diode arrays

Wentao Cai, Xianming Liu, Xiaohua Lei, and Weimin Chen  »View Author Affiliations


Applied Optics, Vol. 52, Issue 34, pp. 8381-8387 (2013)
http://dx.doi.org/10.1364/AO.52.008381


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Abstract

The luminous distribution characteristics of light sources can be measured by goniophotometry. In this work, the misalignment of luminary-induced measurement errors as the main factor affecting the measurement accuracy is analyzed. A calculation method for measurement error is proposed. Then, the translational and angular misalignment-induced measurement errors are calculated and analyzed. Results show that the measurement errors induced by misalignments may be great in some cases even if the far-field condition is satisfied. For luminaries with different radiation patterns, the acceptable misalignment tolerances corresponding to measurement error of less than 1% are given.

© 2013 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.4800) Instrumentation, measurement, and metrology : Optical standards and testing
(120.5240) Instrumentation, measurement, and metrology : Photometry
(220.4840) Optical design and fabrication : Testing
(230.3670) Optical devices : Light-emitting diodes

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: August 28, 2013
Revised Manuscript: November 1, 2013
Manuscript Accepted: November 3, 2013
Published: November 25, 2013

Citation
Wentao Cai, Xianming Liu, Xiaohua Lei, and Weimin Chen, "Analysis of misalignment-induced measurement error for goniophotometry of light-emitting diode arrays," Appl. Opt. 52, 8381-8387 (2013)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-52-34-8381


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