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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 5 — Feb. 10, 2013
  • pp: 1086–1093

Monitoring adsorption and sedimentation using evanescent-wave cavity ringdown ellipsometry

Katerina Stamataki, Vassilis Papadakis, Michael A. Everest, Stelios Tzortzakis, Benoit Loppinet, and T. Peter Rakitzis  »View Author Affiliations


Applied Optics, Vol. 52, Issue 5, pp. 1086-1093 (2013)
http://dx.doi.org/10.1364/AO.52.001086


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Abstract

We monitor the adsorption of Rhodamine 800, and the sedimentation of a polytetrafluoroethylene (PTFE) suspension at the surface of a fused-silica prism, by measuring both the absorption and s-p phase shift Δ of a 740 nm probe laser beam, using evanescent-wave cavity ringdown ellipsometry (EW-CRDE). The two systems demonstrate the complementary strengths of EW-CRDE, as the progress of adsorption of the Rhodamine 800 dye can only be observed sensitively via the measurement of absorption, whereas the progress of sedimentation of PTFE can only be observed sensitively via the measurement of Δ. We show that EW-CRDE provides a sensitive method for the measurement of Δ and demonstrates precision in Δ of about 104deg.

© 2013 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(260.6970) Physical optics : Total internal reflection

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: November 8, 2012
Revised Manuscript: December 21, 2012
Manuscript Accepted: December 23, 2012
Published: February 8, 2013

Citation
Katerina Stamataki, Vassilis Papadakis, Michael A. Everest, Stelios Tzortzakis, Benoit Loppinet, and T. Peter Rakitzis, "Monitoring adsorption and sedimentation using evanescent-wave cavity ringdown ellipsometry," Appl. Opt. 52, 1086-1093 (2013)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-52-5-1086


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References

  1. A. O’Keefe and D. A. G. Deacon, “Cavity ring-down optical spectrometer for absorption measurements using pulsed laser sources,” Rev. Sci. Instrum. 59, 2544–2551 (1988). [CrossRef]
  2. M. D. Wheeler, S. M. Newman, A. J. Orr-Ewing, and M. N. R. Ashfold, “Cavity ring-down spectroscopy,” J. Chem. Soc., Faraday Trans. 94, 337–351 (1998). [CrossRef]
  3. G. Berden, R. Peeters, and G. Meijer, “Cavity ring-down spectroscopy: experimental schemes and applications,” Int. Rev. Phys. Chem. 19, 565–607 (2000). [CrossRef]
  4. B. A. Paldus and A. A. Kachanov, “An historical overview of cavity-enhanced methods,” Can. J. Phys. 83, 975–999 (2005). [CrossRef]
  5. F. de Fornel, Evanescent Waves: From Newtonian Optics to Atomic Optics (Springer, Berlin, 2001).
  6. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light, North-Holland (Amsterdam, 1987).
  7. W. Chen, L. J. Martinez-Miranda, H. Hsiung, and Y. R. Shen, “Orientational wetting behavior of a liquid-crystal homologous series,” Phys. Rev. Lett. 62, 1860–1863 (1989). [CrossRef]
  8. C. Vallance, “Innovations in cavity ring-down spectroscopy,” New J. Chem. 29, 867–874 (2005). [CrossRef]
  9. L. van der Sneppen, F. Ariese, C. Gooijer, and W. Ubachs, “Liquid-phase and evanescent-wave cavity ring-down spectroscopy in analytical chemistry,” Annu. Rev. Anal. Chem. 2, 13–35 (2009). [CrossRef]
  10. M. Schnippering, S.R.T. Neil, S. R. Mackenzie, and P. R. Unwin, “Evanescent wave cavitybased spectroscopic techniques as probes of interfacial processes,” Chem. Soc. Rev. 40, 207–220 (2011). [CrossRef]
  11. H. Waechter, J. Litman, A. H. Cheung, J. A. Barnes, and H.-P. Loock, “Chemical sensing using fiber cavity ring-down spectroscopy,” Sensors 10, 1716–1742 (2010). [CrossRef]
  12. L. van der Sneppen, C. Gooijer, W. Ubachs, and F. Ariese, “Evanescent-wave cavity ringdown detection of cytochrome con surface-modified prisms,” Sens. Actuator B 139, 505–510 (2009). [CrossRef]
  13. A. C. R. Pipino, J. W. Hudgens, and R. E. Huie, “Evanescent wave cavity ring-down spectroscopy with a total-internal-reflection minicavity,” Rev. Sci. Instrum. 68, 2978–2989 (1997). [CrossRef]
  14. R. Engeln, G. Berden, E. van den Berg, and G. Meijer, “Polarization dependent cavity ring down spectroscopy,” J. Chem. Phys. 107, 4458–4467 (1997). [CrossRef]
  15. A. C. R. Pipino, “Ultrasensitive surface spectroscopy with a miniature optical resonator,” Phys. Rev. Lett. 83, 3093–3096(1999). [CrossRef]
  16. A. C. R. Pipino, “Monolithic folded resonator for evanescent wave cavity ringdown spectroscopy,” Appl. Opt. 39, 1449–1453(2000). [CrossRef]
  17. F. P. Li and R. N. Zare, “Molecular orientation study of methylene blue at an air/fused-silica interface using evanescent-wave cavity ring-down spectroscopy,” J. Phys. Chem. B 109, 3330–3333 (2005). [CrossRef]
  18. A. Karaiskou, V. Papadakis, B. Loppinet, and T. P. Rakitzis, “Cavity ring-down ellipsometry,” J. Chem. Phys. 131, 121101(2009). [CrossRef]
  19. M. A. Everest, V. Papadakis, K. Stamataki, S. Tzortzakis, B. Loppinet, and T. P. Rakitzis, “Evanescent-wave cavity ring-down ellipsometry,” J. Phys. Chem. Lett. 2, 1324–1327 (2011). [CrossRef]
  20. M. A. Everest and D. B. Atkinson, “Discrete sums for the rapid determination of exponential decay constants,” Rev. Sci. Instrum. 79, 023108 (2008). [CrossRef]
  21. M.-S. Chen, H.-F. Fan, and K.-C. Lin, “Kinetic and thermodynamic investigation of Rhodamine B adsorption at solid/solvent interfaces by use of evanescent-wave cavity ring-down spectroscopy,” Anal. Chem. 82, 868 (2010). [CrossRef]
  22. S. Patskovsky, I.-H. Song, M. Meunier, and A. V. Kabashin, “Silicon based total internal reflection bio and chemical sensing with spectral phase detection,” Opt. Express 17, 20847–20852 (2009). [CrossRef]
  23. S. Otsuki, K. Tamada, and S. Wakida, “Two-dimensional thickness measurements based on internal reflection ellipsometry,” Appl. Opt. 44, 1410–1415 (2005). [CrossRef]
  24. A. V. Kabashin, P. Evans, S. Pastkovsky, W. Hendren, G. A. Wurtz, R. Atkinson, R. Pollard, V. A. Podolskiy, and A. V. Zayats, “Plasmonic nanorod metamaterials for biosensing,” Nat. Mater. 8, 867–871 (2009). [CrossRef]

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