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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 5 — Feb. 10, 2013
  • pp: 1086–1093

Monitoring adsorption and sedimentation using evanescent-wave cavity ringdown ellipsometry

Katerina Stamataki, Vassilis Papadakis, Michael A. Everest, Stelios Tzortzakis, Benoit Loppinet, and T. Peter Rakitzis  »View Author Affiliations

Applied Optics, Vol. 52, Issue 5, pp. 1086-1093 (2013)

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We monitor the adsorption of Rhodamine 800, and the sedimentation of a polytetrafluoroethylene (PTFE) suspension at the surface of a fused-silica prism, by measuring both the absorption and s-p phase shift Δ of a 740 nm probe laser beam, using evanescent-wave cavity ringdown ellipsometry (EW-CRDE). The two systems demonstrate the complementary strengths of EW-CRDE, as the progress of adsorption of the Rhodamine 800 dye can only be observed sensitively via the measurement of absorption, whereas the progress of sedimentation of PTFE can only be observed sensitively via the measurement of Δ. We show that EW-CRDE provides a sensitive method for the measurement of Δ and demonstrates precision in Δ of about 104deg.

© 2013 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(260.6970) Physical optics : Total internal reflection

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: November 8, 2012
Revised Manuscript: December 21, 2012
Manuscript Accepted: December 23, 2012
Published: February 8, 2013

Katerina Stamataki, Vassilis Papadakis, Michael A. Everest, Stelios Tzortzakis, Benoit Loppinet, and T. Peter Rakitzis, "Monitoring adsorption and sedimentation using evanescent-wave cavity ringdown ellipsometry," Appl. Opt. 52, 1086-1093 (2013)

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