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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 7 — Mar. 1, 2013
  • pp: C50–C57

Extending the depth of focus in tomography systems for glass lattice three-dimensional mapping

Shachar Paz, Alex Zlotnik, and Zeev Zalevsky  »View Author Affiliations


Applied Optics, Vol. 52, Issue 7, pp. C50-C57 (2013)
http://dx.doi.org/10.1364/AO.52.000C50


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Abstract

This paper deals with the development of a computed optical tomography system designed and built to inspect glass lattices to locate various impurities inside the bulk. We focus on the investigation of the potential benefit in the usage of extended depth of focus optics for that application. The quality of 3D reconstruction for the application of glass lattice defect identification is tested numerically and experimentally against the corresponding result obtained with conventional optics.

© 2013 Optical Society of America

OCIS Codes
(100.6950) Image processing : Tomographic image processing
(110.4850) Imaging systems : Optical transfer functions
(170.1630) Medical optics and biotechnology : Coded aperture imaging

History
Original Manuscript: July 31, 2012
Revised Manuscript: December 25, 2012
Manuscript Accepted: December 26, 2012
Published: February 11, 2013

Citation
Shachar Paz, Alex Zlotnik, and Zeev Zalevsky, "Extending the depth of focus in tomography systems for glass lattice three-dimensional mapping," Appl. Opt. 52, C50-C57 (2013)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-52-7-C50

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