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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 9 — Mar. 20, 2013
  • pp: 1805–1813

Measurement of in-plane displacements using the phase singularities generated by directional wavelet transforms of speckle pattern images

Ana Laura Vadnjal, Pablo Etchepareborda, Alejandro Federico, and Guillermo H. Kaufmann  »View Author Affiliations


Applied Optics, Vol. 52, Issue 9, pp. 1805-1813 (2013)
http://dx.doi.org/10.1364/AO.52.001805


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Abstract

We present a method to determine micro and nano in-plane displacements based on the phase singularities generated by application of directional wavelet transforms to speckle pattern images. The spatial distribution of the obtained phase singularities by the wavelet transform configures a network, which is characterized by two quasi-orthogonal directions. The displacement value is determined by identifying the intersection points of the network before and after the displacement produced by the tested object. The performance of this method is evaluated using simulated speckle patterns and experimental data. The proposed approach is compared with the optical vortex metrology and digital image correlation methods in terms of performance and noise robustness, and the advantages and limitations associated to each method are also discussed.

© 2013 Optical Society of America

OCIS Codes
(030.6140) Coherence and statistical optics : Speckle
(100.2000) Image processing : Digital image processing
(120.6150) Instrumentation, measurement, and metrology : Speckle imaging
(350.5030) Other areas of optics : Phase

ToC Category:
Coherence and Statistical Optics

History
Original Manuscript: November 30, 2012
Revised Manuscript: February 7, 2013
Manuscript Accepted: February 7, 2013
Published: March 13, 2013

Citation
Ana Laura Vadnjal, Pablo Etchepareborda, Alejandro Federico, and Guillermo H. Kaufmann, "Measurement of in-plane displacements using the phase singularities generated by directional wavelet transforms of speckle pattern images," Appl. Opt. 52, 1805-1813 (2013)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-52-9-1805

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