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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 9 — Mar. 20, 2013
  • pp: 1913–1918

Low-cost, phase-shifting mechanisms for Newton-type interferometers

Joel Herrera, Esteban Luna, Luis Salas, Erika Sohn, and Elfego Ruiz  »View Author Affiliations

Applied Optics, Vol. 52, Issue 9, pp. 1913-1918 (2013)

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Using standard optical shop equipment, it is possible to implement simple, low-cost, phase-shifting Newton interferometers sufficiently accurate for surface evaluation. The simplification of the phase-shifting mechanism is compensated with image-processing algorithms that can deal with vibrations and uneven, nonsequential steps. The results are cross-compared with a Fizeau phase-shifting interferometer to verify the effectiveness of the method.

© 2013 Optical Society of America

OCIS Codes
(000.3110) General : Instruments, apparatus, and components common to the sciences
(000.4430) General : Numerical approximation and analysis
(100.2650) Image processing : Fringe analysis
(100.5070) Image processing : Phase retrieval
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(100.3175) Image processing : Interferometric imaging

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: November 27, 2012
Revised Manuscript: February 16, 2013
Manuscript Accepted: February 17, 2013
Published: March 14, 2013

Joel Herrera, Esteban Luna, Luis Salas, Erika Sohn, and Elfego Ruiz, "Low-cost, phase-shifting mechanisms for Newton-type interferometers," Appl. Opt. 52, 1913-1918 (2013)

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  1. E. Luna, L. Salas, E. Sohn, E. Ruiz, J. Nunez, and J. Herrera, “Deterministic convergence in iterative phase shifting,” Appl. Opt. 48, 1494–1501 (2009). [CrossRef]
  2. J. Xu, Q. Xu, and L. Chai, “Iterative algorithm for phase extraction from interferograms with random and spatially nonuniform phase shifts,” Appl. Opt. 47, 480–485 (2008). [CrossRef]
  3. M. V. Mantravadi and D. Malacara, “Newton, Fizeau, and Haidenger interferometers,” in Optical Shop Testing, D. Malacara, ed., (Wiley, 2007).
  4. L. Salas, E. Luna, J. Salinas, V. Garcia, and M. Servin, “Profilometry by fringe projection,” Opt. Eng. 42, 3307–3314 (2003). [CrossRef]

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