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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 10 — Apr. 1, 2014
  • pp: 2236–2245

Mueller matrix microscope with a dual continuous rotating compensator setup and digital demodulation

Oriol Arteaga, Marta Baldrís, Joan Antó, Adolf Canillas, Esther Pascual, and Enric Bertran  »View Author Affiliations

Applied Optics, Vol. 53, Issue 10, pp. 2236-2245 (2014)

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In this paper we describe a new Mueller matrix (MM) microscope that generalizes and makes quantitative the polarized light microscopy technique. In this instrument all the elements of the MU are simultaneously determined from the analysis in the frequency domain of the time-dependent intensity of the light beam at every pixel of the camera. The variations in intensity are created by the two compensators continuously rotating at different angular frequencies. A typical measurement is completed in a little over one minute and it can be applied to any visible wavelength. Some examples are presented to demonstrate the capabilities of the instrument.

© 2014 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.5060) Instrumentation, measurement, and metrology : Phase modulation
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(240.2130) Optics at surfaces : Ellipsometry and polarimetry

ToC Category:
Imaging Systems

Original Manuscript: December 18, 2013
Revised Manuscript: February 19, 2014
Manuscript Accepted: February 23, 2014
Published: March 31, 2014

Virtual Issues
Vol. 9, Iss. 6 Virtual Journal for Biomedical Optics

Oriol Arteaga, Marta Baldrís, Joan Antó, Adolf Canillas, Esther Pascual, and Enric Bertran, "Mueller matrix microscope with a dual continuous rotating compensator setup and digital demodulation," Appl. Opt. 53, 2236-2245 (2014)

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