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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 12 — Apr. 20, 2014
  • pp: 2602–2610

Sparse phase-stepping in two-dimensional x-ray phase contrast imaging

Takeshi Kondoh, Takashi Date, Kimiaki Yamaguchi, Kentaro Nagai, Genta Sato, Soichiro Handa, Toru Den, Hidenosuke Itoh, and Takashi Nakamura  »View Author Affiliations


Applied Optics, Vol. 53, Issue 12, pp. 2602-2610 (2014)
http://dx.doi.org/10.1364/AO.53.002602


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Abstract

We have developed a sparse phase-stepping (SPS) method for x-ray Talbot–Lau interferometry, which first constructs a SPS intensity pattern of fewer images than the conventional phase-stepping (PS) method and then fills the data gap with neighboring pixels for phase retrieval. The SPS method is highly beneficial in practice since the fundamental difference in spatial resolution between the SPS and PS methods becomes negligible due to the blur caused by an interferometer. The concept of the SPS method has been proved by the experiment using a small effective source size. Furthermore, the experiment using a large effective source size has verified that in practical situations the SPS method can reduce the required number of images for phase retrieval and still offer the retrieved images with as high a spatial resolution as the PS method.

© 2014 Optical Society of America

OCIS Codes
(170.0110) Medical optics and biotechnology : Imaging systems
(170.3010) Medical optics and biotechnology : Image reconstruction techniques
(170.3660) Medical optics and biotechnology : Light propagation in tissues

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: March 5, 2014
Revised Manuscript: March 6, 2014
Manuscript Accepted: March 6, 2014
Published: April 15, 2014

Virtual Issues
Vol. 9, Iss. 6 Virtual Journal for Biomedical Optics

Citation
Takeshi Kondoh, Takashi Date, Kimiaki Yamaguchi, Kentaro Nagai, Genta Sato, Soichiro Handa, Toru Den, Hidenosuke Itoh, and Takashi Nakamura, "Sparse phase-stepping in two-dimensional x-ray phase contrast imaging," Appl. Opt. 53, 2602-2610 (2014)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-53-12-2602

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