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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 14 — May. 10, 2014
  • pp: 3035–3042

Standoff two-color quantum ghost imaging through turbulence

Yu-Lang Xue, Ren-Gang Wan, Fei Feng, and Tong-Yi Zhang  »View Author Affiliations


Applied Optics, Vol. 53, Issue 14, pp. 3035-3042 (2014)
http://dx.doi.org/10.1364/AO.53.003035


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Abstract

Recently, a two-color quantum ghost imaging configuration was proposed by Karmakar et al. [Phys. Rev. A 81, 033845 (2010)]. By illuminating an object located far away from the source and detector, with a signal beam of long wavelength to avoid absorption of short wavelengths in the atmosphere while a reference beam of short wavelength is detected locally, this imaging configuration can be appropriate for standoff sensing. In practice, the signal beam must propagate through atmosphere in the presence of serious turbulence. We analyzed theoretically the performance of this ghost imaging configuration through turbulence. Based on the Gaussian state source model and extended Huygens–Fresnel integral, a formula is derived to depict the ghost image formed through turbulence of a standoff reflective object. Numerical calculations are also given according to the formula. The results show that the image quality will be degraded by the turbulence, but the resolution can be improved by means of optimizing the wavelengths of the reference and signal beams even when the turbulence is very serious.

© 2014 Optical Society of America

OCIS Codes
(100.2960) Image processing : Image analysis
(280.3640) Remote sensing and sensors : Lidar
(110.0115) Imaging systems : Imaging through turbulent media

ToC Category:
Imaging Systems

History
Original Manuscript: January 28, 2014
Revised Manuscript: March 12, 2014
Manuscript Accepted: April 3, 2014
Published: May 7, 2014

Citation
Yu-Lang Xue, Ren-Gang Wan, Fei Feng, and Tong-Yi Zhang, "Standoff two-color quantum ghost imaging through turbulence," Appl. Opt. 53, 3035-3042 (2014)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-53-14-3035

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