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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 16 — Jun. 1, 2014
  • pp: D1–D11

Standards for ultrashort-laser-pulse-measurement techniques and their consideration for self-referenced spectral interferometry

Michelle Rhodes, Günter Steinmeyer, and Rick Trebino  »View Author Affiliations

Applied Optics, Vol. 53, Issue 16, pp. D1-D11 (2014)

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Issues important for new ultrashort-pulse-measurement techniques include the generation of theoretical example traces for common pulses, validity ranges, ambiguities, coherent artifacts, device calibration sensitivity, iterative retrieval convergence, and feedback regarding measurement accuracy. Unfortunately, in the past, such issues have gone unconsidered, yielding long histories of unsatisfactory measurements. We review these issues here in the hope that future proposers of new techniques will consider them without delay, and, as an example, we address them for a relatively new technique: self-referenced spectral interferometry.

© 2014 Optical Society of America

OCIS Codes
(320.7100) Ultrafast optics : Ultrafast measurements
(320.7110) Ultrafast optics : Ultrafast nonlinear optics

Original Manuscript: November 18, 2013
Revised Manuscript: February 19, 2014
Manuscript Accepted: February 20, 2014
Published: April 1, 2014

Virtual Issues
Vol. 9, Iss. 8 Virtual Journal for Biomedical Optics

Michelle Rhodes, Günter Steinmeyer, and Rick Trebino, "Standards for ultrashort-laser-pulse-measurement techniques and their consideration for self-referenced spectral interferometry," Appl. Opt. 53, D1-D11 (2014)

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