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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 2 — Jan. 10, 2014
  • pp: 200–207

Intensity ratio approach for 3D profile measurement based on projection of triangular patterns

Zongkai Yang, Ke Wu, Jiangtao Xi, and Yanguang Yu  »View Author Affiliations


Applied Optics, Vol. 53, Issue 2, pp. 200-207 (2014)
http://dx.doi.org/10.1364/AO.53.000200


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Abstract

This paper presents an intensity ratio approach for 3D object profilometry measurement based on projection of triangular patterns. Compared to existing intensity ratio approaches, the proposed one is not influenced by the surface reflectivity and ambient light. Moreover, the proposed intensity ratio is point-by-point-based and thus does not suffer from the influence of surrounding points. The performance of the proposed technique has been tested and the advantages have been demonstrated by experiments.

© 2014 Optical Society of America

OCIS Codes
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(150.6910) Machine vision : Three-dimensional sensing

ToC Category:
Machine Vision

History
Original Manuscript: June 26, 2013
Revised Manuscript: October 29, 2013
Manuscript Accepted: December 11, 2013
Published: January 7, 2014

Citation
Zongkai Yang, Ke Wu, Jiangtao Xi, and Yanguang Yu, "Intensity ratio approach for 3D profile measurement based on projection of triangular patterns," Appl. Opt. 53, 200-207 (2014)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-53-2-200

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