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Intensity ratio approach for 3D profile measurement based on projection of triangular patterns

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Abstract

This paper presents an intensity ratio approach for 3D object profilometry measurement based on projection of triangular patterns. Compared to existing intensity ratio approaches, the proposed one is not influenced by the surface reflectivity and ambient light. Moreover, the proposed intensity ratio is point-by-point-based and thus does not suffer from the influence of surrounding points. The performance of the proposed technique has been tested and the advantages have been demonstrated by experiments.

© 2014 Optical Society of America

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