OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 24 — Aug. 20, 2014
  • pp: 5283–5289

Three-dimensional trace measurements for fast-moving objects using binary-encoded fringe projection techniques

Wei-Hung Su, Cho-Yo Kuo, and Fu-Jen Kao  »View Author Affiliations


Applied Optics, Vol. 53, Issue 24, pp. 5283-5289 (2014)
http://dx.doi.org/10.1364/AO.53.005283


View Full Text Article

Enhanced HTML    Acrobat PDF (1120 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

A fringe projection technique to trace the shape of a fast-moving object is proposed. A binary-encoded fringe pattern is illuminated by a strobe lamp and then projected onto the moving object at a sequence of time. Phases of the projected fringes obtained from the sequent measurements are extracted by the Fourier transform method. Unwrapping is then performed with reference to the binary-encoded fringe pattern. Even though the inspected object is colorful, fringe orders can be identified. A stream of profiles is therefore retrieved from the sequent unwrapped phases. This makes it possible to analyze physical properties of the dynamic objects. Advantages of the binary-encoded fringe pattern for phase unwrapping also include (1) reliable performance for colorful objects, spatially isolated objects, and surfaces with large depth discontinuities; (2) unwrapped errors only confined in a local area; and (3) low computation cost.

© 2014 Optical Society of America

OCIS Codes
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(100.5088) Image processing : Phase unwrapping
(110.2650) Imaging systems : Fringe analysis

ToC Category:
Imaging Systems

History
Original Manuscript: May 9, 2014
Revised Manuscript: July 12, 2014
Manuscript Accepted: July 13, 2014
Published: August 12, 2014

Citation
Wei-Hung Su, Cho-Yo Kuo, and Fu-Jen Kao, "Three-dimensional trace measurements for fast-moving objects using binary-encoded fringe projection techniques," Appl. Opt. 53, 5283-5289 (2014)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-53-24-5283


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. M. Takeda and K. Mutoh, “Fourier transform profilometry for the automatic measurement of 3-D object shapes,” Appl. Opt. 22, 3977–3982 (1983). [CrossRef]
  2. W. H. Su and C. K. Lee, “3D shape reconstruction from images blurred by motion,” Opt. Eng. 48, 073604 (2009). [CrossRef]
  3. Q. Zhang, X. Su, Y. Cao, Y. Li, L. Xiang, and W. Chen, “Optical 3-D shape and deformation measurement of rotating blades using stroboscopic structured illumination,” Opt. Eng. 44, 113601 (2005). [CrossRef]
  4. E. Zappa and G. Busca, “Comparison of eight unwrapping algorithms applied to Fourier-transform profilometry,” Opt. Lasers Eng. 46, 106–116 (2008). [CrossRef]
  5. J. M. Huntley and H. O. Saldner, “Temporal phase-unwrapping algorithm for automated interferogram analysis,” Appl. Opt. 32, 3047–3052 (1993). [CrossRef]
  6. H. O. Saldner and J. M. Huntley, “Temporal phase-unwrapping: application to surface profiling of discontinuous objects,” Appl. Opt. 36, 2770–2775 (1997). [CrossRef]
  7. Y. Hao, Y. Zhao, and D. Li, “Multifrequency grating projection profilometry based on the nonlinear excess fraction method,” Appl. Opt. 38, 4106–4110 (1999). [CrossRef]
  8. E. B. Li, X. Peng, J. Xi, J. F. Chicharo, J. Q. Yao, and D. W. Zhang, “Multi-frequency and multiple phase-shift sinusoidal fringe projection for 3D profilometry,” Opt. Express 13, 1561–1569 (2005). [CrossRef]
  9. M. Takeda, Q. Gu, M. Kinoshita, H. Takai, and Y. Takahashi, “Frequency-multiplex Fourier-transform profilometry: a single-shot three-dimensional shape measurement of objects with large height discontinuities and/or surface isolations,” Appl. Opt. 36, 5347–5354 (1997). [CrossRef]
  10. W. H. Su and H. Liu, “Calibration-based two frequency projected fringe profilometry: a robust, accurate, and single-shot measurement for objects with large depth discontinuities,” Opt. Express 14, 9178–9187 (2006). [CrossRef]
  11. W. H. Su, “Color-encoded fringe projection for 3D shape measurements,” Opt. Express 15, 13167–13181 (2007). [CrossRef]
  12. Y. Wang, S. Yang, and X. Gou, “Modified Fourier transform method for 3D profile measurement without phase unwrapping,” Opt. Lett. 35, 790–792 (2010). [CrossRef]
  13. W. H. Su, H. Liu, K. Reichard, S. Yin, and F. T. S. Yu, “Fabrication of digital sinusoidal gratings and precisely controlled diffusive flats and their application to highly accurate projected fringe profilometry,” Opt. Eng. 42, 1730–1740 (2003). [CrossRef]
  14. H. Liu, W. H. Su, K. Reichard, and S. Yin, “Calibration-based phase-shifting projected fringe profilometry for accurate absolute 3D surface profile measurement,” Opt. Commun. 216, 65–80 (2003). [CrossRef]
  15. F. Berryman, P. Pynsent, and J. Cubillo, “A theoretical comparison of three fringe analysis methods for determining the three-dimensional shape of an object in the presence of noise,” Opt. Lasers Eng. 39, 35–50 (2003). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited