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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 4 — Feb. 1, 2014
  • pp: A114–A120

Reverse engineering of multilayer coatings for ultrafast laser applications

M. Trubetskov, T. Amotchkina, A. Tikhonravov, and V. Pervak  »View Author Affiliations

Applied Optics, Vol. 53, Issue 4, pp. A114-A120 (2014)

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We propose a reliable reverse engineering approach for a postproduction characterization of complicated optical coatings for ultrafast laser applications. We perform the postproduction characterization on the basis of in situ broadband monitoring data and validate the results using ex situ transmittance data and group delay measurements.

© 2013 Optical Society of America

OCIS Codes
(310.3840) Thin films : Materials and process characterization
(310.6860) Thin films : Thin films, optical properties
(320.5520) Ultrafast optics : Pulse compression
(320.7080) Ultrafast optics : Ultrafast devices
(310.6805) Thin films : Theory and design

Original Manuscript: August 29, 2013
Manuscript Accepted: October 21, 2013
Published: December 3, 2013

M. Trubetskov, T. Amotchkina, A. Tikhonravov, and V. Pervak, "Reverse engineering of multilayer coatings for ultrafast laser applications," Appl. Opt. 53, A114-A120 (2014)

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  1. T. V. Amotchkina, M. K. Trubetskov, V. Pervak, B. Romanov, and A. V. Tikhonravov, “On the reliability of reverse engineering results,” Appl. Opt. 51, 5543–5551 (2012). [CrossRef]
  2. T. V. Amotchkina, S. Schlichting, H. Ehlers, M. K. Trubetskov, A. V. Tikhonravov, and D. Ristau, “Computational manufacturing as a key element in the design–production chain for modern multilayer coatings,” Appl. Opt. 51, 7604–7615 (2012). [CrossRef]
  3. O. Stenzel, S. Wilbrandt, D. Fasold, and N. Kaiser, “A hybrid in situ monitoring strategy for optical coating deposition: application to the preparation of chirped dielectric mirrors,” J. Opt. A 10, 085305 (2008). [CrossRef]
  4. T. V. Amotchkina, M. K. Trubetskov, A. V. Tikhonravov, S. Schlichting, H. Ehlers, D. Ristau, D. Death, R. J. Francis, and V. Pervak, “Quality control of oblique incidence optical coatings based on normal incidence measurement data,” Opt. Express 21, 21508–21522 (2013). [CrossRef]
  5. T. V. Amotchkina, M. K. Trubetskov, V. Pervak, S. Schlichting, H. Ehlers, D. Ristau, and A. V. Tikhonravov, “Comparison of algorithms used for optical characterization of multilayer optical coatings,” Appl. Opt. 50, 3389–3395 (2011). [CrossRef]
  6. S. Wilbrandt, O. Stenzel, and N. Kaiser, “All-optical in-situ analysis of PIAD deposition processes,” Proc. SPIE 7101, 71010D (2008). [CrossRef]
  7. V. Janicki, J. Sancho-Parramon, O. Stenzel, M. Lappschies, B. Görtz, C. Rickers, C. Polenzky, and U. Richter, “Optical characterization of hybrid antireflective coatings using spectrophotometric and ellipsometric measurements,” Appl. Opt. 46, 6084–6091 (2007). [CrossRef]
  8. A. V. Tikhonravov, T. V. Amotchkina, M. K. Trubetskov, R. J. Francis, V. Janicki, J. Sancho-Parramon, H. Zorc, and V. Pervak, “Optical characterization and reverse engineering based on multiangle spectroscopy,” Appl. Opt. 51, 245–254 (2012). [CrossRef]
  9. L. Gao, F. Lemarchand, and M. Lequime, “Exploitation of multiple incidences spectrometric measurements for thin film reverse engineering,” Opt. Express 20, 15734–15751 (2012). [CrossRef]
  10. M. Trubetskov, A. Tikhonravov, and V. Pervak, “Time-domain approach for designing dispersive mirrors based on the needle optimization technique Theory,” Opt. Express 16, 20637–20647 (2008). [CrossRef]
  11. O. Nohadani, J. R. Birge, F. X. Kärtner, and D. J. Bertsimas, “Robust chirped mirrors,” Appl. Opt. 47, 2630–2636 (2008). [CrossRef]
  12. V. Pervak, I. Ahmad, M. K. Trubetskov, A. V. Tikhonravov, and F. Krausz, “Double-angle multilayer mirrors with smooth dispersion characteristics,” Opt. Express 17, 7943–7951 (2009). [CrossRef]
  13. M. K. Trubetskov, “Design of dispersive mirrors for ultrafast applications,” Chin. Opt. Lett. 8, 12–17 (2010). [CrossRef]
  14. M. K. Trubetskov, V. Pervak, and A. V. Tikhonravov, “Phase optimization of dispersive mirrors based on floating constants,” Opt. Express 18, 27613–27618 (2010). [CrossRef]
  15. V. Pervak, M. K. Trubetskov, and A. V. Tikhonravov, “Robust synthesis of dispersive mirrors,” Opt. Express 19, 2371–2380 (2011). [CrossRef]
  16. V. Pervak, V. Fedorov, Y. A. Pervak, and M. Trubetskov, “Empirical study of the group delay dispersion achievable with multilayer mirrors,” Opt. Express 21, 18311–18316 (2013). [CrossRef]
  17. A. V. Tikhonravov and M. K. Trubetskov, “OptiLayer software,” http://www.optilayer.com .
  18. C. Skrobol, I. Ahmad, S. Klingebiel, C. Wandt, S. A. Trushin, Z. Major, F. Krausz, and S. Karsch, “Broadband amplification by picosecond OPCPA in DKDP pumped at 515  nm,” Opt. Express 20, 4619–4629 (2012). [CrossRef]
  19. V. Pervak, A. V. Tikhonravov, M. K. Trubetskov, S. Naumov, F. Krausz, and A. Apolonski, “1.5-octave chirped mirror for pulse compression down to sub-3  fs,” Appl. Phys. B 87, 5–12 (2007). [CrossRef]
  20. D. Ristau, H. Ehlers, T. Gross, and M. Lappschies, “Optical broadband monitoring of conventional and ion processes,” Appl. Opt. 45, 1495–1501 (2006). [CrossRef]
  21. T. V. Amotchkina, A. V. Tikhonravov, M. K. Trubetskov, D. Grupe, A. Apolonski, and V. Pervak, “Measurement of group delay of dispersive mirrors with white-light interferometer,” Appl. Opt. 48, 949–956 (2009). [CrossRef]
  22. M. K. Trubetskov, M. von Pechmann, I. B. Angelov, K. L. Vodopyanov, F. Krausz, and V. Pervak, “Measurements of the group delay and the group delay dispersion with resonance scanning interferometer,” Opt. Express 21, 6658–6669 (2013). [CrossRef]
  23. V. Pervak, “Recent development and new ideas in the field of dispersive multilayer optics,” Appl. Opt. 50, C55–C61 (2011). [CrossRef]
  24. A. N. Tikhonov and V. I. Arsenin, Solutions of Ill-posed Problems (Winston, 1977).

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