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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 4 — Feb. 1, 2014
  • pp: A114–A120

Reverse engineering of multilayer coatings for ultrafast laser applications

M. Trubetskov, T. Amotchkina, A. Tikhonravov, and V. Pervak  »View Author Affiliations


Applied Optics, Vol. 53, Issue 4, pp. A114-A120 (2014)
http://dx.doi.org/10.1364/AO.53.00A114


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Abstract

We propose a reliable reverse engineering approach for a postproduction characterization of complicated optical coatings for ultrafast laser applications. We perform the postproduction characterization on the basis of in situ broadband monitoring data and validate the results using ex situ transmittance data and group delay measurements.

© 2013 Optical Society of America

OCIS Codes
(310.3840) Thin films : Materials and process characterization
(310.6860) Thin films : Thin films, optical properties
(320.5520) Ultrafast optics : Pulse compression
(320.7080) Ultrafast optics : Ultrafast devices
(310.6805) Thin films : Theory and design

History
Original Manuscript: August 29, 2013
Manuscript Accepted: October 21, 2013
Published: December 3, 2013

Citation
M. Trubetskov, T. Amotchkina, A. Tikhonravov, and V. Pervak, "Reverse engineering of multilayer coatings for ultrafast laser applications," Appl. Opt. 53, A114-A120 (2014)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-53-4-A114


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References

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  22. M. K. Trubetskov, M. von Pechmann, I. B. Angelov, K. L. Vodopyanov, F. Krausz, and V. Pervak, “Measurements of the group delay and the group delay dispersion with resonance scanning interferometer,” Opt. Express 21, 6658–6669 (2013). [CrossRef]
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