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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 4 — Feb. 1, 2014
  • pp: A27–A34

Simulation comparisons of monitoring strategies in narrow bandpass filters and antireflection coatings

Ronald R. Willey  »View Author Affiliations


Applied Optics, Vol. 53, Issue 4, pp. A27-A34 (2014)
http://dx.doi.org/10.1364/AO.53.000A27


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Abstract

This study compares and quantifies the simulated effects of noise, index errors, and photometric level errors on different optical monitoring layer termination strategies. A computer program to simulate optical thin film monitoring has been written for this work. The study looked at these termination methods: quartz crystal monitoring, photometric level cut, two types of turning point termination, and percent of optical extrema monitoring. A narrow bandpass filter and a four-layer antireflection coating design were simulated as examples.

© 2013 Optical Society of America

OCIS Codes
(310.1210) Thin films : Antireflection coatings
(310.1860) Thin films : Deposition and fabrication
(310.6860) Thin films : Thin films, optical properties

History
Original Manuscript: July 23, 2013
Revised Manuscript: September 28, 2013
Manuscript Accepted: September 30, 2013
Published: October 24, 2013

Citation
Ronald R. Willey, "Simulation comparisons of monitoring strategies in narrow bandpass filters and antireflection coatings," Appl. Opt. 53, A27-A34 (2014)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-53-4-A27


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References

  1. R. R. Willey, A. Zöller, “Computer simulation of monitoring of narrow bandpass filters at non-turning points,” 52nd Annual Technical Conference Proceedings (Society of Vacuum Coaters, 2009), pp. 432–437.
  2. R. R. Willey, S. Hicks, M. Biagi, “Analysis of optical monitoring strategies for narrow bandpass filters by software simulation,” 55th Annual Technical Conference Proceedings (Society of Vacuum Coaters, 2012), pp. 253–257.
  3. FilmStar Design from FTG Software Associates, P. O. Box 579, Princeton, New Jersey 08542.
  4. C. Schroedter, “Evaporation monitoring system featuring software trigger points and online evaluation of refractive indices,” Proc. SPIE 652, 15–20 (1986). [CrossRef]
  5. R. R. Willey, “Simulation of the percentage of optical extrema monitoring,” in 56th Annual Technical Conference Proceedings (Society of Vacuum Coaters, 2013).

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