This study compares and quantifies the simulated effects of noise, index errors, and photometric level errors on different optical monitoring layer termination strategies. A computer program to simulate optical thin film monitoring has been written for this work. The study looked at these termination methods: quartz crystal monitoring, photometric level cut, two types of turning point termination, and percent of optical extrema monitoring. A narrow bandpass filter and a four-layer antireflection coating design were simulated as examples.
© 2013 Optical Society of America
Original Manuscript: July 23, 2013
Revised Manuscript: September 28, 2013
Manuscript Accepted: September 30, 2013
Published: October 24, 2013
Ronald R. Willey, "Simulation comparisons of monitoring strategies in narrow bandpass filters and antireflection coatings," Appl. Opt. 53, A27-A34 (2014)