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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 4 — Feb. 1, 2014
  • pp: A27–A34

Simulation comparisons of monitoring strategies in narrow bandpass filters and antireflection coatings

Ronald R. Willey  »View Author Affiliations


Applied Optics, Vol. 53, Issue 4, pp. A27-A34 (2014)
http://dx.doi.org/10.1364/AO.53.000A27


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Abstract

This study compares and quantifies the simulated effects of noise, index errors, and photometric level errors on different optical monitoring layer termination strategies. A computer program to simulate optical thin film monitoring has been written for this work. The study looked at these termination methods: quartz crystal monitoring, photometric level cut, two types of turning point termination, and percent of optical extrema monitoring. A narrow bandpass filter and a four-layer antireflection coating design were simulated as examples.

© 2013 Optical Society of America

OCIS Codes
(310.1210) Thin films : Antireflection coatings
(310.1860) Thin films : Deposition and fabrication
(310.6860) Thin films : Thin films, optical properties

History
Original Manuscript: July 23, 2013
Revised Manuscript: September 28, 2013
Manuscript Accepted: September 30, 2013
Published: October 24, 2013

Citation
Ronald R. Willey, "Simulation comparisons of monitoring strategies in narrow bandpass filters and antireflection coatings," Appl. Opt. 53, A27-A34 (2014)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-53-4-A27

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