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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 4 — Feb. 1, 2014
  • pp: A35–A41

Spectral angle resolved scattering of thin film coatings

Sven Schröder, David Unglaub, Marcus Trost, Xinbin Cheng, Jinlong Zhang, and Angela Duparré  »View Author Affiliations


Applied Optics, Vol. 53, Issue 4, pp. A35-A41 (2014)
http://dx.doi.org/10.1364/AO.53.000A35


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Abstract

The light scattering of interference coatings is strongly dependent on the wavelength. In addition to the general strong increase of scattering as the wavelengths get shorter, dramatic scatter effects in and around the resonance regions can occur. This is discussed in detail for highly reflective and chirped mirrors. A new instrument is presented which enables spectral angle resolved scatter measurements of high-quality optical components to be performed between 250 and 1500 nm.

© 2013 Optical Society of America

OCIS Codes
(240.5770) Optics at surfaces : Roughness
(290.0290) Scattering : Scattering
(310.0310) Thin films : Thin films

History
Original Manuscript: August 22, 2013
Revised Manuscript: October 10, 2013
Manuscript Accepted: October 11, 2013
Published: November 6, 2013

Citation
Sven Schröder, David Unglaub, Marcus Trost, Xinbin Cheng, Jinlong Zhang, and Angela Duparré, "Spectral angle resolved scattering of thin film coatings," Appl. Opt. 53, A35-A41 (2014)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-53-4-A35


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References

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