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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 4 — Feb. 1, 2014
  • pp: A412–A416

Scattering losses in multidielectric structures designed for giant optical field enhancement

Aude L. Lereu, Myriam Zerrad, Césaire Ndiaye, Fabien Lemarchand, and Claude Amra  »View Author Affiliations

Applied Optics, Vol. 53, Issue 4, pp. A412-A416 (2014)

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Multidielectric coatings are analytically designed to reach total absorption and maximum field enhancement at resonances. A resonant multi-dielectric stack was fabricated to be resonant at 633 nm for an incidence of 45° under TE-polarization. Field enhancement was expected to be around 1000. We discuss the mismatch with the enhancement measured using near field microscopy and using the scattering effect. In particular, scattering was investigated to serve as a far field characterization of such giant optical fields.

© 2014 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(310.6860) Thin films : Thin films, optical properties
(290.1483) Scattering : BSDF, BRDF, and BTDF
(310.4165) Thin films : Multilayer design

Original Manuscript: September 9, 2013
Revised Manuscript: January 7, 2014
Manuscript Accepted: January 8, 2014
Published: January 28, 2014

Aude L. Lereu, Myriam Zerrad, Césaire Ndiaye, Fabien Lemarchand, and Claude Amra, "Scattering losses in multidielectric structures designed for giant optical field enhancement," Appl. Opt. 53, A412-A416 (2014)

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