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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 4 — Feb. 1, 2014
  • pp: A62–A69

Nanosecond laser-induced damage of nodular defects in dielectric multilayer mirrors [Invited]

Xinbin Cheng, Abudusalamu Tuniyazi, Jinlong Zhang, Tao Ding, Hongfei Jiao, Bin Ma, Zeyong Wei, Hongqiang Li, and Zhanshan Wang  »View Author Affiliations

Applied Optics, Vol. 53, Issue 4, pp. A62-A69 (2014)

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Our recent studies on nodular damage in dielectric multilayer mirrors were first reviewed, and the main findings are taken as a foundation to further investigate the influence of seed absorptivity and asymmetrical boundary on the laser-induced damage of nodules. Experimental results showed that the seed absorptivity had a big influence on laser-induced damage thresholds (LIDTs) of the prepared nodules. A direct link between the cross-sectional | E | 2 distributions and damage morphologies of nodules was found, which can perfectly explain the observed dependence of LIDTs on seed absorptivity. Another series of asymmetrical nodules were also studied in this work. The measured LIDTs of asymmetrical nodules were about 40%–70% lower than the LIDTs of the symmetrical nodules initiating from the same-sized SiO 2 seeds. The weaker mechanical stability and the nonuniform | E | 2 distributions are two main reasons for the lower laser damage resistance of the asymmetrical nodules.

© 2013 Optical Society of America

OCIS Codes
(000.4430) General : Numerical approximation and analysis
(140.3330) Lasers and laser optics : Laser damage
(290.5850) Scattering : Scattering, particles
(310.0310) Thin films : Thin films
(160.1245) Materials : Artificially engineered materials

Original Manuscript: August 20, 2013
Revised Manuscript: October 15, 2013
Manuscript Accepted: October 16, 2013
Published: November 14, 2013

Xinbin Cheng, Abudusalamu Tuniyazi, Jinlong Zhang, Tao Ding, Hongfei Jiao, Bin Ma, Zeyong Wei, Hongqiang Li, and Zhanshan Wang, "Nanosecond laser-induced damage of nodular defects in dielectric multilayer mirrors [Invited]," Appl. Opt. 53, A62-A69 (2014)

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