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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 5 — Feb. 10, 2014
  • pp: 850–860

Optical properties and laser damage threshold of HfO2–SiO2 mixed composite thin films

Shuvendu Jena, Raj Bahadur Tokas, Nitin M. Kamble, Sudhakar Thakur, and Naba Kishore Sahoo  »View Author Affiliations


Applied Optics, Vol. 53, Issue 5, pp. 850-860 (2014)
http://dx.doi.org/10.1364/AO.53.000850


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Abstract

HfO2SiO2 mixed composite thin films have been deposited on fused silica substrate by co-evaporation of HfO2 and SiO2 through the reactive electron-beam evaporation technique. The composition-dependent refractive index and the absorption coefficient have been analyzed using different effective medium approximation (EMA) models in order to evaluate the suitability of these models for such mixed composite thin films. The discrepancies between experimentally determined and EMA-computed values are explained through microstructural and morphological evolutions observed in these mixed composite films. Finally, the dependence of the laser damage threshold as a function of silica content has been investigated, and the improved laser-induced damage threshold for films having more than 80% silica content has been explained through the defect-assisted multiphoton ionization process.

© 2014 Optical Society of America

OCIS Codes
(140.3330) Lasers and laser optics : Laser damage
(160.4670) Materials : Optical materials
(160.4760) Materials : Optical properties
(240.5770) Optics at surfaces : Roughness
(310.3840) Thin films : Materials and process characterization
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Thin Films

History
Original Manuscript: September 12, 2013
Revised Manuscript: November 21, 2013
Manuscript Accepted: December 13, 2013
Published: February 5, 2014

Citation
Shuvendu Jena, Raj Bahadur Tokas, Nitin M. Kamble, Sudhakar Thakur, and Naba Kishore Sahoo, "Optical properties and laser damage threshold of HfO2–SiO2 mixed composite thin films," Appl. Opt. 53, 850-860 (2014)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-53-5-850


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